Rudeger H. T. Wilke

SrxBa1−xNb2O6−δ Ferroelectric-thermoelectrics: Crystal anisotropy, conduction mechanism, and power factor

Nonstoichiometric tungsten bronze-structured ferroelectric SrxBa1−xNb2O6−δ (SBN) single crystals were found to be a promising n-type thermoelectric oxide. Thermopower anomalies were observed at the phase transition temperatures, depending on the degree of reduction as well as crystal anisotropy. Above 500 K, heavily reduced SBN crystals show high thermoelectric power factors (∼20 μW/cm K2 at 516 K) with both thermopower and electrical conductivity higher parallel to the c-axis. It is noted that the power factor increases with temperature due to the semiconducting behavior with high carrier concentration. The carrier transport mechanism also varies with the degree of reduction and temperature.

Sputter deposition of PZT piezoelectric films on thin glass substrates for adjustable x-ray optics

Piezoelectric PbZr(0.52)Ti(0.48)O(3) (PZT) thin films deposited on thin glass substrates have been proposed for adjustable optics in future x-ray telescopes. The light weight of these x-ray optics enables large collecting areas, while the capability to correct mirror figure errors with the PZT thin film will allow much higher imaging resolution than possible with conventional lightweight optics. However, the low strain temperature and flexible nature of the thin glass complicate the use of chemical-solution deposition due to warping of the substrate at typical crystallization temperatures for the PZT. RF magnetron sputtering enabled preparation of PZT films with thicknesses up to 3 μm on Schott D263 glass substrates with much less deformation. X-ray diffraction analysis indicated that the films crystallized with the perovskite phase and showed no indication of secondary phases. Films with 1 cm(2) electrodes exhibited relative permittivity values near 1100 and loss tangents below 0.05. In addition, the remanent polarization was 26 μC/cm(2) with coercive fields of 33 kV/cm. The transverse piezoelectric coefficient was as high as -6.1±0.6 C/m(2). To assess influence functions for the x-ray optics application, the piezoelectrically induced deflection of individual cells was measured and compared with finite-element-analysis calculations. The good agreement between the results suggests that actuation of PZT thin films can control mirror figure errors to a precision of about 5 nm, allowing sub-arcsecond imaging.

In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

Ferroelectric/ferroelastic domain reorientation was measured in a 1.9 μm thick tetragonal {001} oriented PbZr0.3Ti0.7O3 thin film doped with 1% Mn under different mechanical boundary constraints. Domain reorientation was quantified through the intensity changes in the 002/200 Bragg reflections as a function of applied electric field. To alter the degree of clamping, films were undercut from the underlying substrate by 0%, ∼25%, ∼50%, or ∼75% of the electrode area. As the amount of declamping from the substrate increased from 0% to ∼75%, the degree of ferroelectric/ferroelastic domain reorientation in the films increased more than six fold at three times the coercive field. In a film that was ∼75% released from the substrate, approximately 26% of 90° domains were reoriented under the maximum applied field; this value for domain reorientation compares favorably to bulk ceramics of similar compositions. An estimate for the upper limit of 90° domain reorientation in a fully released film under these condition...

Development status of adjustable grazing incidence optics for 0.5 arcsecond X-ray imaging

We describe progress in the development of adjustable grazing incidence X-ray optics for 0.5 arcsec resolution cosmic X-ray imaging. To date, no optics technology is available to blend high resolution imaging like the Chandra X-ray Observatory, with square meter collecting area. Our approach to achieve these goals simultaneously is to directly deposit thin film piezoelectric actuators on the back surface of thin, lightweight Wolter-I or Wolter- Schwarschild mirror segments. The actuators are used to correct mirror figure errors due to fabrication, mounting and alignment, using calibration and a one-time figure adjustment on the ground. If necessary, it will also be possible to correct for residual gravity release and thermal effects on-orbit. In this paper we discuss our most recent results measuring influence functions of the piezoelectric actuators using a Shack-Hartmann wavefront sensor. We describe accelerated and real-time lifetime testing of the piezoelectric material, and we also discuss changes to, and recent results of, our simulations of mirror correction.

PZT piezoelectric films on glass for Gen-X imaging

The proposed adaptive optics system for the Gen-X telescope uses piezoelectric lead zirconate titanate (PZT) films deposited on flexible glass substrates. The low softening transition of the glass substrates imposes several processing challenges that require the development of new approaches to deposit high quality PZT thin films. Synthesis and optimization of chemical solution deposited 1 μm thick films of PbZr0.52Ti0.48O3 on small area (1 in2) and large area (16 in2) Pt/Ti/glass substrates has been performed. In order to avoid warping of the glass at temperatures typically used to crystallize PZT films (~700°C), a lower temperature, two-step crystallization process was employed. An ~80 nm thick seed layer of PbZr0.30Ti0.70O3 was deposited to promote the growth of the perovskite phase. After the deposition of the seed layer, the films were annealed in a rapid thermal annealing (RTA) furnace at 550°C for 3 minutes to nucleate the perovskite phase. This was followed by isothermal annealing at 550°C for 1 hour to complete crystallization. For the subsequent PbZr0.52Ti0.48O3 layers, the same RTA protocol was performed, with the isothermal crystallization implemented following the deposition of three PbZr0.52Ti0.48O3 spin-coated layers. Over the frequency range of 1 kHz to 100 kHz, films exhibit relative permittivity values near 800 with loss tangents below 0.07. Hysteresis loops show low levels of imprint with coercive fields of 40-50 kV/cm in the forward direction and 50-70 kV/cm in the reverse direction. The remanent polarization varied from 25-35 μC/cm2 and e31,f values were approximately -5.0 C/m2. In scaling up the growth procedure to large area films, where warping becomes more pronounced due to the increased size of the substrate, the pyrolysis and crystallization conditions were performed in a box furnace to improve the temperature uniformity. By depositing films on both sides of the glass substrate, the tensile stresses are balanced, providing a sufficiently flat surface to continue PZT deposition. The properties of the large area film are comparable to those obtained on small substrates. While sol-gel processing is a viable approach to the deposition of high quality PZT thin films on glass substrates, preliminary results using RF magnetron sputter deposition demonstrate comparable properties with a significantly simpler process that offers a superior route for large scale production.

Ferroelectric/Ferroelastic domain wall motion in dense and porous tetragonal lead zirconate titanate films

Direct evidence of ferroelectric/ferroelastic domain reorientation is shown in Pb(Zr0.30Ti0.70)O3 (PZT30/70) thin films clamped to a rigid silicon substrate using in situ synchrotron X-ray diffraction during application of electric fields. Both dense films and films with 3 to 4 vol% porosity were measured. On application of electric fields exceeding the coercive field, it is shown that the porous films exhibit a greater volume fraction of ferroelastic domain reorientation (approximately 12 vol% of domains reorient at 3 times the coercive field, Ec) relative to the dense films (~3.5 vol% at 3Ec). Furthermore, the volume fraction of domain reorientation significantly exceeded that predicted by linear mixing rules. The high response of domain reorientation in porous films is discussed in the context of two mechanisms: local enhancement of the electric field near the pores and a reduction of substrate clamping resulting from the lowering of the film stiffness as a result of the porosity. Similar measurements during weak-field (subcoercive) amplitudes showed 0.6% volume fraction of domains reoriented for the porous films, which demonstrates that extrinsic effects contribute to the dielectric and piezoelectric properties.

Adjustable grazing incidence x-ray optics based on thin PZT films

The direct deposition of piezoelectric thin films on thin substrates offers an appealing technology for the realization of lightweight adjustable mirrors capable of sub-arcsecond resolution. This solution will make it possible to realize X-ray telescopes with both large effective area and exceptional angular resolution and, in particular, it will enable the realization of the adjustable optics for the proposed mission Square Meter Arcsecond Resolution X-ray Telescope (SMART-X). In the past years we demonstrated for the first time the possibility of depositing a working piezoelectric thin film (1-5 um) made of lead-zirconate-titanate (PZT) on glass. Here we review the recent progress in film deposition and influence function characterization and comparison with finite element models. The suitability of the deposited films is analyzed and some constrains on the piezoelectric film performances are derived. The future steps in the development of the technology are described.

Technology development of adjustable grazing incidence x-ray optics for sub-arc second imaging

We report on technical progress made over the past year developing thin film piezoelectric adjustable grazing incidence optics. We believe such mirror technology represents a solution to the problem of developing lightweight, sub-arc second imaging resolution X-ray optics. Such optics will be critical to the development next decade of astronomical X-ray observatories such as SMART-X, the Square Meter Arc Second Resolution X-ray Telescope. SMART-X is the logical heir to Chandra, with 30 times the collecting area and Chandra-like imaging resolution, and will greatly expand the discovery space opened by Chandra’s exquisite imaging resolution. In this paper we discuss deposition of thin film piezoelectric material on flat glass mirrors. For the first time, we measured the local figure change produced by energizing a piezo cell – the influence function, and showed it is in good agreement with finite element modeled predictions. We determined that at least one mirror substrate material is suitably resistant to piezoelectric deposition processing temperatures, meaning the amplitude of the deformations introduced is significantly smaller than the adjuster correction dynamic range. Also, using modeled influence functions and IXO-based mirror figure errors, the residual figure error was predicted post-correction. The impact of the residual figure error on imaging performance, including any mid-frequency ripple introduced by the corrections, was modeled. These, and other, results are discussed, as well as future technology development plans.

High-Resolution X-Ray Telescopes

High-energy astrophysics is a relatively young scientific field, made possible by space-borne telescopes. During the half-century history of x-ray astronomy, the sensitivity of focusing x-ray telescopes-through finer angular resolution and increased effective area-has improved by a factor of a 100 million. This technological advance has enabled numerous exciting discoveries and increasingly detailed study of the high-energy universe-including accreting (stellarmass and super-massive) black holes, accreting and isolated neutron stars, pulsar-wind nebulae, shocked plasma in supernova remnants, and hot thermal plasma in clusters of galaxies. As the largest structures in the universe, galaxy clusters constitute a unique laboratory for measuring the gravitational effects of dark matter and of dark energy. Here, we review the history of high-resolution x-ray telescopes and highlight some of the scientific results enabled by these telescopes. Next, we describe the planned next-generation x-ray-astronomy facility-the International X-ray Observatory (IXO). We conclude with an overview of a concept for the next next-generation facility-Generation X. The scientific objectives of such a mission will require very large areas (about 10000 m2) of highly-nested lightweight grazing-incidence mirrors with exceptional (about 0.1-arcsecond) angular resolution. Achieving this angular resolution with lightweight mirrors will likely require on-orbit adjustment of alignment and figure.

Generation-X mirror technology development plan and the development of adjustable x-ray optics

Generation-X is being studied as an extremely high resolution, very large area grazing incidence x-ray telescope. Under a NASA Advanced Mission Concepts Study, we have developed a technology plan designed to lead to the 0.1 arcsec (HPD) resolution adjustable optics with 50 square meters of effective area necessary to meet Generation-X requirements. We describe our plan in detail. In addition, we report on our development activities of adjustable grazing incidence optics via the fabrication of bimorph mirrors. We have successfully deposited thin-film piezo-electric material on the back surface of thin glass mirrors. We report on the electrical and mechanical properties of the bimorph mirrors. We also report on initial finite element modeling of adjustable grazing incidence mirrors; in particular, we examine the impact of how the mirrors are supported - the boundary conditions - on the deformations which can be achieved.