S.R. Chalana

Surface plasmon resonance in nanostructured Ag incorporated ZnS films

Silver incorporated zinc sulfide thin films are prepared by RF magnetron sputtering technique and the influence of silver incorporation on the structural, optical and luminescence properties is analyzed using techniques like grazing incidence X-Ray diffraction (GIXRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDS), micro-Raman spectroscopy, UV-Vis spectroscopy and laser photoluminescence spectroscopy. XRD analysis presents hexagonal wurtzite structure for the films. A reduction of crystallinity of the films is observed due to Ag incorporation. The Raman spectral analysis confirms the reduction of crystallinity and increase of strain due to the Ag incorporation. AFM analysis reveals a rough surface morphology for the undoped film and Ag incorporation makes the films uniform, dense and smooth. A blue shift of band gap energy with increase in Ag incorporation is observed due to quantum confinement effect. An absorption band (450...

Laser ablated nanostructured zinc sulphide thin films for optoelectronics device applications

ZnS thin films are prepared by pulsed laser deposition and the effect of annealing temperature on the structural and optical properties of ZnS films is investigated systematically using techniques like X-ray diffraction (XRD), Atomic force microscopy (AFM), UV-VIS spectroscopy and Photoluminescence spectroscopy (PL). The XRD pattern of the film annealed at 600 °C show a less intense XRD peak of hexagonal ZnO. In the photoluminescence spectra, an orange emission is observed for the films with 325 nm excitation.

Laser ablated nanostructured tin oxide thin films for optoelectronic device applications

Nanostructured tin oxide (SnO2) thin films are prepared by pulsed laser deposition technique and the films are annealed at different temperatures viz. 300, 400, 500 and 600 °C. The as-deposited and annealed films are characterized by X-ray diffraction, Micro-Raman spectroscopy, Atomic force microscopy, UV-visible spectroscopy and Photoluminescence spectroscopy. The films annealed at higher temperature exhibit more intense and sharper X-ray diffraction peaks compared to other annealed films showing their enhanced crystallinity. Raman spectra of nanocrystalline tin oxide exhibits very broad spectral feature extending from 400– 700 cm−1. All the films exhibit a broad luminescence band centered on 376 nm and a blue emission at 450 and 470 nm.