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Dive into the research topics where Samuel Kay Doran is active.

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Featured researches published by Samuel Kay Doran.


26th Annual International Symposium on Microlithography | 2001

PREVAIL: EPL alpha tool electron optics subsystem

Hans C. Pfeiffer; Rajinder S. Dhaliwal; Steven D. Golladay; Samuel Kay Doran; Michael S. Gordon; Rodney A. Kendall; Jon Erik Lieberman; David J. Pinckney; Robert Joseph Quickle; Christopher F. Robinson; James D. Rockrohr; Werner Stickel; Eileen V. Tressler

The IBM/Nikon alliance is continuing pursuit of an EPL stepper alpha tool based on the PREVAIL technology. This paper provides a status report of the alliance activity with particular focus on the Electron Optical Subsystem developed at IBM. We have previously reported on design features of the PREVAIL alpha system. The new state-of-the-art e-beam lithography concepts have since been reduced to practice and turned into functional building blocks of a production level lithography tool. The electron optical alpha tool subsystem has been designed, build, assembled and tested at IBMs Semiconductor Research and Development Center (SRDC) in East Fishkill, New York. After demonstrating subsystem functionality, the electron optical column and all associated control electronics hardware and software have been shipped during January 2001 to Nikons facility in Kumagaya, Japan, for integration into the Nikon commercial e-beam stepper alpha tool. Early pre-shipment results obtained with this electron optical subsystem are presented.


Archive | 1987

Electron beam writing method and system using large range deflection in combination with a continuously moving table

Donald Eugene Davis; Samuel Kay Doran; Merlyn H Perkins; Hans C. Pfeiffer


Archive | 1990

Servo guided stage system

Samuel Kay Doran; Robert Kendall


Archive | 1996

Compensated servo control stage positioning apparatus

Samuel Kay Doran


Archive | 1996

Electron beam nano-metrology system

Samuel Kay Doran; William A. Enichen; Timothy R. Groves; Rodney A. Kendall; Henri Antoine Khoury; Richard D. Moore; Paul F. Petric; James D. Rockrohr


Archive | 1981

Automatic focus and deflection correction in E-beam system using optical target height measurements

William Wolf Blair; Samuel Kay Doran; Guenther O. Langner


Archive | 1984

Method and apparatus for controlling alignment and brightness of an electron beam

Samuel Kay Doran; Donald F. Haire; Ralph R. Trotter


Archive | 1997

Real time alignment system for a projection electron beam lithographic system

Samuel Kay Doran


Archive | 1978

Method and apparatus for applying focus correction in E-beam system

Drew Edward Albrecht; Samuel Kay Doran; Michel Salib Michail; Hannon S. Yourke


Archive | 2001

REAL TIME MEASUREMENT OF LEAKAGE CURRENT IN HIGH VOLTAGE ELECTRON GUNS

Michael S. Gordon; Samuel Kay Doran

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