Samuel Kay Doran
IBM
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26th Annual International Symposium on Microlithography | 2001
Hans C. Pfeiffer; Rajinder S. Dhaliwal; Steven D. Golladay; Samuel Kay Doran; Michael S. Gordon; Rodney A. Kendall; Jon Erik Lieberman; David J. Pinckney; Robert Joseph Quickle; Christopher F. Robinson; James D. Rockrohr; Werner Stickel; Eileen V. Tressler
The IBM/Nikon alliance is continuing pursuit of an EPL stepper alpha tool based on the PREVAIL technology. This paper provides a status report of the alliance activity with particular focus on the Electron Optical Subsystem developed at IBM. We have previously reported on design features of the PREVAIL alpha system. The new state-of-the-art e-beam lithography concepts have since been reduced to practice and turned into functional building blocks of a production level lithography tool. The electron optical alpha tool subsystem has been designed, build, assembled and tested at IBMs Semiconductor Research and Development Center (SRDC) in East Fishkill, New York. After demonstrating subsystem functionality, the electron optical column and all associated control electronics hardware and software have been shipped during January 2001 to Nikons facility in Kumagaya, Japan, for integration into the Nikon commercial e-beam stepper alpha tool. Early pre-shipment results obtained with this electron optical subsystem are presented.
Archive | 1987
Donald Eugene Davis; Samuel Kay Doran; Merlyn H Perkins; Hans C. Pfeiffer
Archive | 1990
Samuel Kay Doran; Robert Kendall
Archive | 1996
Samuel Kay Doran
Archive | 1996
Samuel Kay Doran; William A. Enichen; Timothy R. Groves; Rodney A. Kendall; Henri Antoine Khoury; Richard D. Moore; Paul F. Petric; James D. Rockrohr
Archive | 1981
William Wolf Blair; Samuel Kay Doran; Guenther O. Langner
Archive | 1984
Samuel Kay Doran; Donald F. Haire; Ralph R. Trotter
Archive | 1997
Samuel Kay Doran
Archive | 1978
Drew Edward Albrecht; Samuel Kay Doran; Michel Salib Michail; Hannon S. Yourke
Archive | 2001
Michael S. Gordon; Samuel Kay Doran