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Scott Ward

Texas Instruments

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Featured researches published by Scott Ward.

electrical overstress electrostatic discharge symposium | 2016

JS-002 module and product CDM result comparison to JEDEC and ESDA CDM methods

Alan Righter; Robert Ashton; B. Carn; Marty Johnson; B. Reynolds; Theo Smedes; Scott Ward; H. Wolf

CDM standard JS-002 is introduced, including the reasons for its development and the technical issues the new standard addresses. JS-002 is compared to the JEDEC JESD22-C101, ESDA and AEC Q100 CDM standards in terms of waveforms and integrated circuit pass/fail levels. JS-002 robustness levels are similar to JEDEC CDM levels.

electrical overstress electrostatic discharge symposium | 2011

Capturing real world ESD stress with event detector

Agha Jahanzeb; Kankan Wang; Jeff Harrop; Jonathan Brodsky; Toshio Ban; Scott Ward; Joe Schichl; Keith Burgess; Charvaka Duvvury

2009 31st EOS/ESD Symposium | 2009

FCDM measurements of small devices

M. Johnson; Robert Ashton; Scott Ward

2009 31st EOS/ESD Symposium | 2009

Influence of CDM tester plate size on discharge current

Agha Jahanzeb; Charvaka Duvvury; Joe Schichl; James McGee; Steve Marum; Scott Ward

electrical overstress electrostatic discharge symposium | 2008

Single pulse CDM testing and its relevance to IC reliability

Agha Jahanzeb; Charvaka Duvvury; Joe Schichl; James McGee; Steve Marum; Peter L. Koeppen; Scott Ward; Yen-Yi Lin

electrical overstress electrostatic discharge symposium | 2012

Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results

Alan Righter; Terry Welsher; Marti Farris; Marty Johnson; Scott Ward; Marcel Dekker; Tim Maloney; Robert Ashton; Leo G. Henry; Tom Meuse; Jon Barth; Evan Grund; Theo Smedes; Paul Ngan

electrical overstress electrostatic discharge symposium | 2010

Overcoming the unselected pin relay capacitance HBM tester artifact with two pin HBM testing

Scott Ward; Keith Burgess; Evan Grund; Joe Schichl; Charvaka Duvvury; Peter L. Koeppen; Hans Kunz

electrical overstress electrostatic discharge symposium | 2014

Threshold voltage shift due to incidental pulse on non-stressed pins during HBM testing

Yue Zu; Liang Wang; Rajkumar Sankaralingam; Scott Ward; Joe Schichl

electrical overstress electrostatic discharge symposium | 2012

Considerations for CDM standards alignment: Analysis of a common hardware solution across different CDM tester models

Scott Ward; Marty Johnson

electrical overstress electrostatic discharge symposium | 2012

Sampling pin approaches for ESD test applications

Charvaka Duvvury; Joel Dobson; Robert J. Gauthier; Evan Grund; Brett Carn; Wolfgang Stadler; James W. Miller; Terry Welsher; Reinhold Gaertner; Scott Ward; M. Chaine; Alan Righter

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Charvaka Duvvury

Texas Instruments

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Joe Schichl

Texas Instruments

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Agha Jahanzeb

Texas Instruments

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Keith Burgess

Texas Instruments

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Marty Johnson

Texas Instruments

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Evan Grund

IBM

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Alan Righter

Analog Devices

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Robert Ashton

ON Semiconductor

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Hans Kunz

Texas Instruments

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James McGee

Texas Instruments

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