Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Seong-Yeon Kim is active.

Publication


Featured researches published by Seong-Yeon Kim.


IEEE Electron Device Letters | 2017

A Novel Technique for Curing Hot-Carrier-Induced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET

Geon-Beom Lee; Choong-Ki Kim; Jun-Young Park; Tewook Bang; Hagyoul Bae; Seong-Yeon Kim; Seung-Wan Ryu; Yang-Kyu Choi

The hot-carrier-induced damage of a gate dielectric was cured with Joule heat generated by the forward current of the p-n junction between the body and drain, for the first time. The effective recovery voltage and pulse timewere optimized to cure the gate dielectricdamage produced by hot-carrier injection. Moreover, iterative damage and cyclic curing were experimentally demonstrated. Throughlow-frequency noise analyses, the degradationand recovery were verified by identifying trap density along the depth of the gate dielectric. Furthermore, this proposed method produced nearly the same recovery characteristics through source-to-body junction current in a short-channel device.


Nano Energy | 2017

Full paperPrecursor designs for Cu2ZnSn(S,Se)4 thin-film solar cells

Kee-Jeong Yang; Jun-Hyoung Sim; Dae-Ho Son; Youngill Kim; Dae-Hwan Kim; Dahyun Nam; Hyeonsik Cheong; Seong-Yeon Kim; JunHo Kim; Jin-Kyu Kang


ACS Nano | 2017

Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments

Kyu-Man Hwang; Jun-Young Park; Hagyoul Bae; Seung-Wook Lee; Choong-Ki Kim; Myungsoo Seo; Hwon Im; Do Hyun Kim; Seong-Yeon Kim; Geon-Beom Lee; Yang-Kyu Choi


Physica Status Solidi (a) | 2018

Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage (Phys. Status Solidi A 14∕2018)

Jun-Young Park; Dong-Il Moon; Seong-Yeon Kim; Hwon Im; Ki Soo Chang; Chanbae Jeong; Yang-Kyu Choi


Physica Status Solidi (a) | 2018

Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage

Jun-Young Park; Dong-Il Moon; Seong-Yeon Kim; Hwon Im; Ki Soo Chang; Chanbae Jeong; Yang-Kyu Choi


Nano Energy | 2018

Self-powered data erasing of nanoscale flash memory by triboelectricity

Ik Kyeong Jin; Jun-Young Park; Byung-Hyun Lee; Seung-Bae Jeon; Il-Woong Tcho; Sang-Jae Park; Weon-Guk Kim; Joon-Kyu Han; Seung-Wook Lee; Seong-Yeon Kim; Hagyoul Bae; Daewon Kim; Yang-Kyu Choi


International Conference on Electronics, Information, and Communication | 2018

A Study of Hot-Carrier Injection Influenced by Doping Concentration in a Junctionless-mode Gate-All-Around Field Effect Transistor with 5-story Vertically Integrated Nanowires

Seong-Yeon Kim; Seung-Wook Lee; Myungsoo Seo; Do-Hyun Kim; Choong-Ki Kim; Hagyoul Bae; Byung-Hyun Lee; Yang-Kyu Choi


IEEE Transactions on Electron Devices | 2018

A Comprehensive Study of a Single-Transistor Latch in Vertical Pillar-Type FETs With Asymmetric Source and Drain

Seung-Wook Lee; Seong-Yeon Kim; Kyu-Man Hwang; Ik Kyeong Jin; Jae Hur; Do Hyun Kim; Jun Woo Son; Wu-Kang Kim; Yang-Kyu Choi


IEEE Transactions on Electron Devices | 2018

Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC

Do Hyun Kim; Sung Kwan Lim; Hagyoul Bae; Choong-Ki Kim; Seung-Wook Lee; Myungsoo Seo; Seong-Yeon Kim; Kyu-Man Hwang; Geon-Beom Lee; Byoung Hun Lee; Yang-Kyu Choi


IEEE Electron Device Letters | 2018

{I}

Seong-Yeon Kim; Byung-Hyun Lee; Jae Hur; Jun-Young Park; Seung-Bae Jeon; Seung-Wook Lee; Yang-Kyu Choi

Collaboration


Dive into the Seong-Yeon Kim's collaboration.

Researchain Logo
Decentralizing Knowledge