Shinhyun Choi

Electrochemical dynamics of nanoscale metallic inclusions in dielectrics.

Nanoscale metal inclusions in or on solid-state dielectrics are an integral part of modern electrocatalysis, optoelectronics, capacitors, metamaterials and memory devices. The properties of these composite systems strongly depend on the size, dispersion of the inclusions and their chemical stability, and are usually considered constant. Here we demonstrate that nanoscale inclusions (for example, clusters) in dielectrics dynamically change their shape, size and position upon applied electric field. Through systematic in situ transmission electron microscopy studies, we show that fundamental electrochemical processes can lead to universally observed nucleation and growth of metal clusters, even for inert metals like platinum. The clusters exhibit diverse dynamic behaviours governed by kinetic factors including ion mobility and redox rates, leading to different filament growth modes and structures in memristive devices. These findings reveal the microscopic origin behind resistive switching, and also provide general guidance for the design of novel devices involving electronics and ionics.

Comprehensive Physical Model of Dynamic Resistive Switching in an Oxide Memristor

Memristors have been proposed for a number of applications from nonvolatile memory to neuromorphic systems. Unlike conventional devices based solely on electron transport, memristors operate on the principle of resistive switching (RS) based on redistribution of ions. To date, a number of experimental and modeling studies have been reported to probe the RS mechanism; however, a complete physical picture that can quantitatively describe the dynamic RS behavior is still missing. Here, we present a quantitative and accurate dynamic switching model that not only fully accounts for the rich RS behaviors in memristors in a unified framework but also provides critical insight for continued device design, optimization, and applications. The proposed model reveals the roles of electric field, temperature, oxygen vacancy concentration gradient, and different material and device parameters on RS and allows accurate predictions of diverse set/reset, analog switching, and complementary RS behaviors using only material-dependent device parameters.

Oxide heterostructure resistive memory.

Resistive switching devices are widely believed as a promising candidate for future memory and logic applications. Here we show that by using multilayer oxide heterostructures the switching characteristics can be systematically controlled, ranging from unipolar switching to complementary switching and bipolar switching with linear and nonlinear on-states and high endurance. Each layer can be tailed for a specific function during resistance switching, thus greatly improving the degree of control and flexibility for optimized device performance.

Experimental Demonstration of a Second-Order Memristor and Its Ability to Biorealistically Implement Synaptic Plasticity

Memristors have been extensively studied for data storage and low-power computation applications. In this study, we show that memristors offer more than simple resistance change. Specifically, the dynamic evolutions of internal state variables allow an oxide-based memristor to exhibit Ca(2+)-like dynamics that natively encode timing information and regulate synaptic weights. Such a device can be modeled as a second-order memristor and allow the implementation of critical synaptic functions realistically using simple spike forms based solely on spike activity.

Tuning Resistive Switching Characteristics of Tantalum Oxide Memristors through Si Doping

An oxide memristor device changes its internal state according to the history of the applied voltage and current. The principle of resistive switching (RS) is based on ion transport (e.g., oxygen vacancy redistribution). To date, devices with bi-, triple-, or even quadruple-layered structures have been studied to achieve the desired switching behavior through device structure optimization. In contrast, the device performance can also be tuned through fundamental atomic-level design of the switching materials, which can directly affect the dynamic transport of ions and lead to optimized switching characteristics. Here, we show that doping tantalum oxide memristors with silicon atoms can facilitate oxygen vacancy formation and transport in the switching layer with adjustable ion hopping distance and drift velocity. The devices show larger dynamic ranges with easier access to the intermediate states while maintaining the extremely high cycling endurance (>10(10) set and reset) and are well-suited for neuromorphic computing applications. As an example, we demonstrate different flavors of spike-timing-dependent plasticity in this memristor system. We further provide a characterization methodology to quantitatively estimate the effective hopping distance of the oxygen vacancies. The experimental results are confirmed through detailed ab initio calculations which reveal the roles of dopants and provide design methodology for further optimization of the RS behavior.

Data Clustering using Memristor Networks

Memristors have emerged as a promising candidate for critical applications such as non-volatile memory as well as non-Von Neumann computing architectures based on neuromorphic and machine learning systems. In this study, we demonstrate that memristors can be used to perform principal component analysis (PCA), an important technique for machine learning and data feature learning. The conductance changes of memristors in response to voltage pulses are studied and modeled with an internal state variable to trace the analog behavior of the device. Unsupervised, online learning is achieved in a memristor crossbar using Sanger’s learning rule, a derivative of Hebb’s rule, to obtain the principal components. The details of weights evolution during training is investigated over learning epochs as a function of training parameters. The effects of device non-uniformity on the PCA network performance are further analyzed. We show that the memristor-based PCA network is capable of linearly separating distinct classes from sensory data with high clarification success of 97.6% even in the presence of large device variations.

Experimental Demonstration of Feature Extraction and Dimensionality Reduction Using Memristor Networks

Memristors have been considered as a leading candidate for a number of critical applications ranging from nonvolatile memory to non-Von Neumann computing systems. Feature extraction, which aims to transform input data from a high-dimensional space to a space with fewer dimensions, is an important technique widely used in machine learning and pattern recognition applications. Here, we experimentally demonstrate that memristor arrays can be used to perform principal component analysis, one of the most commonly used feature extraction techniques, through online, unsupervised learning. Using Sangers rule, that is, the generalized Hebbian algorithm, the principal components were obtained as the memristor conductances in the network after training. The network was then used to analyze sensory data from a standard breast cancer screening database with high classification success rate (97.1%).

Retention failure analysis of metal-oxide based resistive memory

Resistive switching devices (RRAMs) have been proposed a promising candidate for future memory and neuromorphic applications. Central to the successful application of these emerging devices is the understanding of the resistance switching and failure mechanism, and identification of key physical parameters that will enable continued device optimization. In this study, we report detailed retention analysis of a TaOx based RRAM at high temperatures and the development of a microscopic oxygen diffusion model that fully explains the experimental results and can be used to guide future device developments. The device conductance in low resistance state (LRS) was constantly monitored at several elevated temperatures (above 300 °C), and an initial gradual conductivity drift followed by a sudden conductance drop were observed during retention failure. These observations were explained by a microscopic model based on oxygen vacancy diffusion, which quantitatively explains both the initial gradual conductance drift and the sudden conductance drop. Additionally, a non-monotonic conductance change, with an initial conductance increase followed by the gradual conductance decay over time, was observed experimentally and explained within the same model framework. Specifically, our analysis shows that important microscopic physical parameters such as the activation energy for oxygen vacancy migration can be directly calculated from the failure time versus temperature relationship. Results from the analytical model were further supported by detailed numerical multi-physics simulation, which confirms the filamentary nature of the conduction path in LRS and the importance of oxygen vacancy diffusion in device reliability. Finally, these high-temperature stability measurements also reveal the existence of multiple filaments in the same device.