Shinji Fujii

Semiconductor integrated circuit capable of compensating errors in manufacturing process

Switching constant current source circuit

Level translator capable of high speed operation

Differential current source circuit in DAC of current driving type

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE COMPRISING DIFFERENT LEVEL INTERCONNECTION LAYERS CONNECTED BY CONDUCTOR LAYERS INCLUDING CONDUCTOR LAYER FOR REDUNDANCY

Automated bias control (ABC) circuit for high-performance VLSIs

Automated Bias Control (ABC) Circuit for High-Performance VLSI's

Semiconductor device provided using wiring data of common design core

Observation Technique for Process-Induced Defects Using Anodic Oxidation (Special Issue on Scientific ULSI Manufacturing Technology)

Microstructure Analysis Technique of Specific Area by Transmission Electron Microscopy (Special Issue on LSI Failure Analysis)