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Publication


Featured researches published by Shuichi Chikamatsu.


Archive | 2005

Apparatus and method for testing defects

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuyai Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2000

Defect inspecting device and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 1999

Optical apparatus for defect and particle size inspection

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuya Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2010

Defect Inspection Method and Defect Inspection Apparatus

Yukihiro Shibata; Shunji Maeda; Shuichi Chikamatsu


Archive | 2010

Defect inspection system

Kenji Aiko; Shuichi Chikamatsu; Minori Noguchi; Hisafumi Iwata


Archive | 2005

Defect inspection device and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 2007

DEFECT INSPECTING APPARATUS

Shuichi Chikamatsu; Minori Noguchi; Kenji Aiko


Archive | 2009

Method of detecting defects on an object

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuyai Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2004

Defects inspection apparatus and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 2008

INSPECTING DEVICE AND INSPECTING METHOD

Hideki Fukushima; Minori Noguchi; Shuichi Chikamatsu

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