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Latest external collaboration on country level. Dive into details by clicking on the dots.

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Dive into the research topics where Takahiro Jingu is active.

Publication


Featured researches published by Takahiro Jingu.


Archive | 2013

Defect inspection device and defect inspection method

Toshifumi Honda; Yuta Urano; Takahiro Jingu; Akira Hamamatsu


Archive | 2012

Inspection method and inspection device

Izuo Horai; Hirokazu Koyabu; Yuta Urano; Takahiro Jingu


Archive | 2005

Apparatus and method for testing defects

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuyai Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2000

Defect inspecting device and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 2007

Method and its apparatus for inspecting particles or defects of a semiconductor device

Hidetoshi Nishiyama; Minori Noguchi; Yoshimasa Ooshima; Akira Hamamatsu; Kenji Watanabe; Tetsuya Watanabe; Takahiro Jingu


Archive | 1999

Optical apparatus for defect and particle size inspection

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuya Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2012

Inspection method and inspection apparatus

Akira Hamamatsu; Minori Noguchi; Hidetoshi Nishiyama; Yoshimasa Ohshima; Takahiro Jingu; Sachio Uto


Archive | 1996

Manufacture of electronic part

Naoki Go; Toshimitsu Hamada; Seiji Ishikawa; Takahiro Jingu; Masataka Shiba; Kenji Watanabe; Tetsuya Watanabe; Toshiaki Yanai; 利満 浜田; 健二 渡辺; 哲也 渡辺; 誠二 石川; 孝広 神宮; 正孝 芝; 俊明 谷内; 直樹 郷


Archive | 1997

System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value

Masataka Shiba; Kenji Watanabe; Toshimitsu Hamada; Seiji Ishikawa; Naoki Go; Toshiaki Yachi; Tetsuya Watanabe; Takahiro Jingu


Archive | 2002

Defect inspecting apparatus and defect inspection method

Rei Hamamatsu; Takahiro Jingu; Toshihiko Nakada; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Yukio Uto; Masahiro Watanabe; 俊彦 中田; 良正 大島; 幸雄 宇都; 玲 浜松; 正浩 渡辺; 孝広 神宮; 英利 西山; 稔 野口

Collaboration


Dive into the Takahiro Jingu's collaboration.

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