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Dive into the research topics where Yoshio Morishige is active.

Publication


Featured researches published by Yoshio Morishige.


Archive | 2005

Apparatus and method for testing defects

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuyai Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 2000

Defect inspecting device and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 1999

Optical apparatus for defect and particle size inspection

Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Shunichi Matsumoto; Yukio Kembo; Ryouji Matsunaga; Keiji Sakai; Takanori Ninomiya; Tetsuya Watanabe; Hisato Nakamura; Takahiro Jingu; Yoshio Morishige; Shuichi Chikamatsu


Archive | 1996

Surface inspection method and apparatus

Tetsuya Watanabe; Yoshio Morishige; Hisato Nakamura


Archive | 2006

Method of inspecting a semiconductor device and an apparatus thereof

Akira Hamamatsu; Minori Noguchi; Yoshimasa Ohshima; Hidetoshi Nishiyama; Kenji Oka; Takanori Ninomiya; Maki Tanaka; Kenji Watanabe; Tetsuya Watanabe; Yoshio Morishige


Archive | 1996

Extraneous substance inspection apparatus for patterned wafer

Yoshio Morishige; Hisato Nakamura; Tetsuya Watanabe


Archive | 2000

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, INSPECTION CONDITION OBTAINING METHOD, SELECTION METHOD THEREOF, AND INSPECTION DEVICE AND METHOD THEREFOR

Rei Hamamatsu; Yoshio Morishige; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Kenji Oka; Yoshimasa Oshima; Maki Tanaka; Kenji Watanabe; Tetsuya Watanabe; 隆典 二宮; 良正 大島; 健次 岡; 良夫 森重; 玲 浜松; 健二 渡辺; 哲也 渡邊; 麻紀 田中; 英利 西山; 稔 野口


Archive | 1996

Extraneous substance inspection method and apparatus

Hisato Nakamura; Tetsuya Watanabe; Yoshio Morishige


Archive | 2005

Defect inspection device and method

Shuichi Chikamatsu; Takahiro Jingu; Yukio Kenbo; Shunichi Matsumoto; Ryoji Matsunaga; Yoshio Morishige; Hisato Nakamura; Takanori Ninomiya; Hidetoshi Nishiyama; Minoru Noguchi; Yoshimasa Oshima; Shigetoshi Sakai; Tetsuya Watanabe; 寿人 中村; 隆典 二宮; 良正 大島; 俊一 松本; 良治 松永; 良夫 森重; 哲也 渡邊; 孝広 神宮; 英利 西山; 行雄 見坊; 秀一 近松; 恵寿 酒井; 稔 野口


Archive | 1997

Surface defect inspection device and shading correction method therefor

Hisato Nakamura; Yoshio Morishige; Tetsuya Watanabe

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