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Dive into the research topics where Sönke Tautz is active.

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Featured researches published by Sönke Tautz.


Applied Physics Letters | 2009

InGaN laser diodes with 50 mW output power emitting at 515 nm

Adrian Avramescu; Teresa Lermer; Jens Müller; Sönke Tautz; Désirée Queren; Stephan Lutgen; Uwe Strauß

We demonstrate direct green laser operation from InGaN based diodes at wavelengths as long as 515.9 nm with 50 mW output power in pulse operation. A factor of ∼10 defect reduction for the In-rich InGaN quantum wells based on improvements of the epitaxial growth process and design of the active layers on c-plane GaN-substrates makes it possible to demonstrate laser operation at room temperature. Micrometer-scale photoluminescence mappings and electro-optical measurements confirm the reduction of nonradiative defects in the emitting layers. The 11 μm broad-area gain-guided laser structures were driven in pulse operation to minimize thermal effects and to accurately measure the laser temperature dependence. The threshold current density was ∼9 kA/cm2 and the fitted slope efficiency had a value of ∼130 mW/A for an optical output up to 50 mW.


Applied Physics Letters | 2006

Investigation of dark line defects induced by catastrophic optical damage in broad-area AlGaInP laser diodes

M. Bou Sanayeh; Arndt Jaeger; Wolfgang Schmid; Sönke Tautz; Peter Brick; Klaus Streubel; G. Bacher

The authors present a detailed investigation of defects generated during catastrophic optical damage (COD) in high-power 650nm AlGaInP lasers using microphotoluminescence (μ-PL) mapping, focused ion beam (FIB) microscopy, and deep-etching techniques. High-resolution μ-PL images demonstrated that during COD, nonradiative dark line defects (DLDs) originate from the front mirror of the laser and propagate in several branches into the laser perpendicular to the output facet. Furthermore, FIB microscopy identified the epitaxial layers affected by COD, revealing that DLDs are confined to the active region. In addition, deep etching confirmed that these defects have a noncrystalline nature.


Optics Express | 2008

Spectral dynamics of 405 nm (Al,In)GaN laser diodes grown on GaN and SiC substrate

Tobias Meyer; Harald Braun; Ulrich T. Schwarz; Sönke Tautz; Marc Schillgalies; Stephan Lutgen; Uwe Strauss

We investigate the spectral properties of violet 405 nm (Al,In)GaN laser diodes (LDs). Depending on the substrate the LDs are grown on, the lasing spectra show significant differences. LDs grown on low dislocation GaN substrate have a broad spectrum with several longitudinal modes, while LDs grown on SiC substrate are lasing on a single longitudinal mode.With increasing current, the laser emission of LDs grown on SiC substrate jumps from one longitudinal mode to another (mode hopping), whereas GaN substrate LDs show a smooth but asymmetric mode comb. The different envelopes of these spectra can be understood by assuming a variation of the gain for each individual longitudinal mode. With a high spectral resolution setup, we measure the gain of each longitudinal mode, employing the Hakki-Paoli method. Measurements show a slightly fluctuating gain for the modes of GaN substrate LDs, but much larger fluctuations for LDs on SiC substrate. We carry out simulations of the longitudinal mode spectrum of (Al,In)GaN laser diodes using a rate equation model with nonlinear gain (self saturation, symmetric and asymmetric cross saturation) and including gain fluctuations. With a set of parameters which is largely identical for LDs on either substrate, the simulated spectra truly resemble those typical for LDs on GaN or SiC substrate.


Proceedings of SPIE | 2012

Beyond blue pico laser: development of high power blue and low power direct green

Clemens Vierheilig; Christoph Eichler; Sönke Tautz; Alfred Lell; Jens Müller; Fabian Kopp; Bernhard Stojetz; Thomas Hager; Georg Brüderl; Adrian Avramescu; Teresa Lermer; Jelena Ristic; Uwe Strauss

There is a big need on R&D concerning visible lasers for projection applications. The pico-size mobile projection on the one hand awaits the direct green lasers with sufficiently long lifetimes at optical powers above 50mW. In this paper we demonstrate R&D-samples emitting at 519nm with lifetimes up to 10.000 hours. The business projection on the other hand requires high power operation and already uses blue lasers and phosphor conversion, but there is a strong demand for higher power levels. We investigate the power limits of R&D laser structures. In continuous wave operation, the power is limited by thermal roll-over. With an excellent power conversion efficiency of up to 29% the thermal roll-over is as high as 2.5W for a single emitter in TO56 can. We do not observe significant leakage at high currents. Driven in short pulse operation to prevent the laser from self heating, linear laser characteristics of optical power versus electrical current are observed up to almost 8W of optical power.


Applied Physics Letters | 2006

Observation of deep level defects within the waveguide of red-emitting high-power diode lasers

Claus Ropers; Tran Quoc Tien; Christoph Lienau; Jens W. Tomm; Peter Brick; Norbert Linder; Bernd Mayer; Martin Müller; Sönke Tautz; Wolfgang Schmid

The waveguides of 650nm emitting high-power laser diodes are analyzed regarding the presence of deep level defects by photoelectrical techniques, namely, photocurrent spectroscopy, laser beam induced current, and near-field optical beam induced current (NOBIC). Deep level configurations in pristine devices and the kinetics of defect creation during device operation are monitored and discussed. The localization of the defects within the epitaxial layer sequence is done by NOBIC. We show that light, which is confined within the laser waveguide, interacts with the deep level defects detected. This demonstrates that the presence of deep level defects directly affects the device properties.


Applied Physics Letters | 1996

Polarization dependence of the electroabsorption in low‐temperature grown GaAs for above band‐gap energies

M. Ruff; D. Streb; S. U. Dankowski; Sönke Tautz; Peter Kiesel; B. Knüpfer; M. Kneissl; Norbert Linder; G. H. Döhler; U. D. Keil

We have measured the electroabsorption in low‐temperature grown GaAs by performing room‐temperature transmission experiments in the spectral range from 1.3 to 1.9 eV for different electric fields induced by a voltage applied to a metal‐semiconductor‐metal structure. The devices were separated from the substrate by using an epitaxial liftoff technique. Therefore, we have been able to observe the electro‐optic effect at the fundamental band gap as well as at the split‐off band edge. The absorption is clearly polarization dependent at the fundamental band gap but only weakly at the split‐off band gap, in agreement with the theory of the Franz–Keldysh effect.


Applied Physics Letters | 2009

Burn-in mechanism of 450nm InGaN ridge laser test structures

Jens Müller; Georg Brüderl; Marc Schillgalies; Sönke Tautz; Dimitri Dini; Andreas Breidenassel; Bastian Galler; Stephan Lutgen

We investigated the short term stability of the optical output power of 450nm InGaN test lasers. The short term degradation strongly depended on ridge width. It was mainly caused by an increase in threshold current. From measurements of subthreshold wave-length blueshift, carrier lifetime, and output power, we found a decrease in carrier density after 15h of aging. We show a direct correlation of the short term aging with current spreading effects.


Applied Physics Letters | 1997

Femtosecond differential transmission measurements on low temperature GaAs metal–semiconductor–metal structures

Ulrich D. Keil; Jo; rn M. Hvam; Sönke Tautz; S. U. Dankowski; P. Kiesel; G. H. Döhler

We report on differential transmission measurements on low temperature grown (LT)-GaAs with and without applied electrical fields at different wavelengths. Electrical fields up to 100 kV/cm can be applied via an interdigitated contact structure to our LT GaAs samples which have been removed from the substrate by epitaxial lift off. In the presence of an electric field, both, the absorption bleaching due to phase space filling and field induced absorption changes due to the Franz–Keldysh effect contribute to the transmission changes. We observe an extended carrier lifetime with applied field. The response time of a biased metal–semiconductor–metal detector, therefore, exceeds the carrier life time of the substrate material.


Japanese Journal of Applied Physics | 2013

Blue Superluminescent Light-Emitting Diodes with Output Power above 100 mW for Picoprojection

Fabian Kopp; Christoph Eichler; Alfred Lell; Sönke Tautz; Jelena Ristic; Bernhard Stojetz; Christine Höß; Thomas Weig; Ulrich T. Schwarz; Uwe Strauss

We present a blue InGaN research and development superluminescent light-emitting diode (SLED) that is suitable for picoprojection. The SLED reaches an output power of >100 mW with a peak wavelength of 443 nm and a spectral bandwidth of >2.6 nm as well as a single-mode far-field driven in cw mode at 25 °C. In order to figure out an optimized waveguide design, which enables such a high output power at lowest operation current, we compare the performance of diodes with curved and tilted shaped ridges in detail, using the lasing threshold current as a criterion for lasing or superluminescence, respectively.


Applied Physics Letters | 2010

Gain analysis of blue nitride-based lasers by small signal modulation

Jens Müller; M. Scheubeck; M. Sabathil; Georg Brüderl; Dimitri Dini; Sönke Tautz; Teresa Lermer; Andreas Breidenassel; Stephan Lutgen

With a small signal frequency-modulation of the driving current, the resonance frequency and the damping factor of the optical output power response of blue nitride-based ridge lasers grown on [0001]-plane gallium-nitride substrates were investigated with a network analyzer setup. From the linear dependence of the squared resonance frequency on the driving current, the gain coefficients of the logarithmic gain model could be extracted being 7680 cm−1 for blue nitride-based lasers. For this purpose, additional parameters such as the carrier density and the confinement factor were assigned by carrier lifetime and quantum efficiency measurements and one dimensional transfer matrix simulations, respectively.

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Uwe Strauss

Osram Opto Semiconductors GmbH

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Christoph Eichler

Osram Opto Semiconductors GmbH

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Stephan Lutgen

Osram Opto Semiconductors GmbH

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Dimitri Dini

Osram Opto Semiconductors GmbH

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Frank Baumann

Osram Opto Semiconductors GmbH

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Jens Müller

Osram Opto Semiconductors GmbH

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Kirstin Petersen

Osram Opto Semiconductors GmbH

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Teresa Lermer

Osram Opto Semiconductors GmbH

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Adrian Avramescu

Osram Opto Semiconductors GmbH

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