Tad J. Wilder | Researchain

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Featured researches published by Tad J. Wilder.

Archive | 2008

Partial good integrated circuit and method of testing same

Leonard O. Farnsworth; Michael Z. Felske; Pamela S. Gillis; Benjamin P. Lynch; Michael R. Ouellette; Thomas St. Pierre; Tad J. Wilder; Carl Barnhart

Archive | 2009

Chip design and fabrication method optimized for profit

Nathan C. Buck; Howard H. Chen; James P. Eckhardt; Eric A. Foreman; James C. Gregerson; Peter A. Habitz; Susan K. Lichtensteiger; Chandramouli Visweswariah; Tad J. Wilder

Archive | 2005

METHOD FOR RETICLE SHAPES ANALYSIS AND CORRECTION

Peter A. Habitz; David J. Hathaway; Jerry D. Hayes; Anthony D. Polson; Tad J. Wilder

Archive | 2012

Flexible performance screen ring oscillator within a scan chain

Margaret R. Charlebois; Christopher D. Hanudel; Robert D. Herzl; David W. Milton; Clarence R. Ogilvie; Paul M. Schanely; Tad J. Wilder

Archive | 2009

METHOD AND APPARATUS FOR INCREASED EFFECTIVENESS OF DELAY AND TRANSISTION FAULT TESTING

Pamela S. Gillis; John R. Smith; Tad J. Wilder; Francis Woytowich; Tian Xia

Archive | 2008

Structure for identifying and implementing flexible logic block logic for easy engineering changes

Robert D. Herzl; Robert S. Horton; Kenneth A. Lauricella; David W. Milton; Clarence R. Ogilvie; Paul M. Schanely; Nitin Sharma; Tad J. Wilder; Charles B. Winn

Archive | 2010

METHOD AND SYSTEM TO OPTIMIZE SEMICONDUCTOR PRODUCTS FOR POWER, PERFORMANCE, NOISE, AND COST THROUGH USE OF VARIABLE POWER SUPPLY VOLTAGE COMPRESSION

Jeanne P. Bickford; Umberto Garofano; James E. Jasmin; Ivan L. Wemple; Tad J. Wilder

Archive | 2008

Design structure for facilitating engineering changes in integrated circuits

Clarence R. Ogilvie; Charles B. Winn; David W. Milton; Kenneth A. Lauricella; Nitin Sharma; Paul M. Schanely; Robert D. Herzl; Robert S. Horton; Tad J. Wilder; Douglas P. Nadeau

Archive | 2004