Takayuki Mori

Super steep subthreshold slope PN-body tied SOI FET with ultra low drain voltage down to 0.1V

We propose and demonstrate a super steep Subthreshold Slope (SS) new type SOI FET with a PN-body tied structure. It has a symmetry source and drain (S/D) structure. The device shows a super steep SS (<;6mV/dec) over 3 decades of the drain current with an ultralow drain voltage down to 0.1V. It also shows a low leakage current (below 1pA/um), a good Id-Vd characteristic and a negligible hysteresis characteristic.

Mechanism of super steep subthreshold slope characteristics with body-tied SOI MOSFET

Super steep subthreshold slope characteristics in the FB and the BT are investigated with TCAD. The mechanism of the enhanced DIBL and the addition of the positive feedback PBT action by the forward biased emitter-base voltage are proposed to explain the difference between the FB and the BT.

Possibility of SOI based super steep subthreshold slope MOSFET for ultra low voltage application

Ultra Low Power (ULP) LSIs require the steep subthreshold slope (SS) MOSFET. However, the theoretical SS limit of the conventional MOSFET is 60mV/dec at the room temperature. Recently, devices which have the less than 60mV/dec SS, such as the Tunnel FET (TFET) and the Impact Ionization MOS (I-MOS), have been studied. In addition to those, the steep SS MOSFETs using the Floating-Body (FB) SOI have been proposed. In this work, we report our finding of the FB and the Body-Tied (BT) SOI MOSFET with the super steep SS (<; 1mV/Dec) characteristics with the 0.15um SOI. We also discuss the possibility of it as a switching device for the ultra low voltage application, where we consider that the three points are the issues to improve; reducing the operation voltage, increasing Ion/Ioff ratios which also pay attention keeping the low Ioff, controlling hysteresis characteristics.