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Dive into the research topics where Tarun Mudgal is active.

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Featured researches published by Tarun Mudgal.


229th ECS Meeting (May 29 - June 2, 2016) | 2016

Investigation on Alumina Passivation for Improved IGZO TFT Performance

Tarun Mudgal; Nicholas Edwards; Prashant Ganesh; Anish Bharadwaj; Robert G. Manley; Karl D. Hirschman

A study of the influence of back-channel alumina passivation on the operation of bottom-gate IGZO TFTs is presented. TFTs without any passivation material deposited typically exhibit best-case initial results. Regardless a passivation layer is required for device stability and process integration. The impact of passivation using alumina deposited via electron beam evaporation and atomic layer deposition (ALD) has been investigated. A decrease in subthreshold slope and channel mobility on certain treatment combinations is attributed to an inferior IGZO/alumina back-channel interface. A two-step passivation process has been developed which offers back-channel protection during device fabrication, and remains compatible with an oxidizing ambient anneal. Modifications in the passivation and annealing procedures and process integration details have resulted in a marked improvement in the performance of alumina passivated devices, with demonstrated resistance to aging.


225th ECS Meeting (May 11-15, 2014) | 2014

Impact of Annealing on Contact Formation and Stability of IGZO TFTs

Tarun Mudgal; Nathaniel Walsh; Robert G. Manley; Karl D. Hirschman


MRS Proceedings | 2012

A Comparative Study on the Activation Behavior of Implanted Boron and Phosphorus for LTPS Using Solid-Phase Crystallization

Qinglong Li; Tarun Mudgal; Patricia Meller; Seth Slavin; Robert G. Manley; Karl D. Hirschman


MRS Proceedings | 2014

Crystallization of Amorphous Silicon and Dopant Activation using Xenon Flash-Lamp Annealing (FLA)

Tarun Mudgal; C. Reepmeyer; R.G. Manley; Denis Cormier; Karl D. Hirschman


MRS Proceedings | 2014

Passivation and Annealing for Improved Stability of High Performance IGZO TFTs

Tarun Mudgal; N. Walsh; R.G. Manley; Karl D. Hirschman


2014 ECS and SMEQ Joint International Meeting (October 5-9, 2014) | 2014

Interpretation of Defect States in Sputtered IGZO Devices Using I-V and C-V Analysis

Tarun Mudgal; Nathaniel Walsh; Nicholas Edwards; Robert G. Manley; Karl D. Hirschman


ECS Transactions | 2018

A 2D Empirical Model for On-State Operation of Scaled IGZO TFTs Exemplifying the Physical Response of TCAD Simulation

Karl D. Hirschman; Tarun Mudgal; Eli Powell; Robert G. Manley


ECS Journal of Solid State Science and Technology | 2017

Communication—CMOS Thin-Film Transistors via Xe Flash-Lamp Crystallization of Patterned Amorphous Si

Tarun Mudgal; K. Bhadrachalam; P. Bischoff; D. Cormier; R. G. Manley; Karl D. Hirschman


231st ECS Meeting (May 28 - June 1, 2017) | 2017

Recovery of Bias-Stress Ionized Igzo/SiO2 Interface States Via Cryogenic Relaxation

Tarun Mudgal; Anish Bharadwaj; Prashant Ganesh; Eli Powell; Robert G. Manley; Karl D. Hirschman


PRiME 2016/230th ECS Meeting (October 2-7, 2016) | 2016

Investigation on the Gate Electrode Configuration of IGZO TFTs for Improved Channel Control and Suppression of Bias-Stress Induced Instability

Tarun Mudgal; Nicholas Edwards; Prashant Ganesh; Anish Bharadwaj; Eli Powell; Michael S Pierce; Robert G. Manley; Karl D. Hirschman

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Karl D. Hirschman

Rochester Institute of Technology

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Robert G. Manley

Rochester Institute of Technology

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N. Walsh

Rochester Institute of Technology

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C. Reepmeyer

Rochester Institute of Technology

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Denis Cormier

Rochester Institute of Technology

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N. Edwards

Rochester Institute of Technology

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Patricia Meller

Rochester Institute of Technology

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Qinglong Li

Rochester Institute of Technology

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Seth Slavin

Rochester Institute of Technology

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