Timothy L. Jackson

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Design, process integration, and characterization for microelectronics. Conference | 2002

Timothy L. Jackson; Richard J. Markle; Clinton W. Miller; Edward C. Stewart; Robert A. Crowell

We will discuss Advanced Micro Devicess (AMD) Fault Detection and Classification (FDC) program strategy and our six-step project template that we have identified that must be addressed for any successful FDC effort. We will discuss the recent development and implementation of a wafer-level FDC system on a TEL CLEAN TRAC ACT 8 photo track system in AMDs Fab25, a high volume microprocessor factory. We will present our approach to designing and implementing this FDC system and demonstrate its ability to automatically identify specific wafers within a lot that require manual review. Upon manual review, the decision can be made to rework the specific wafers or the lot.

Archive | 2003

Naomi M. Jenkins; Timothy L. Jackson; Howard E. Castle; Brian K. Cusson

Archive | 2001

Timothy L. Jackson; Richard J. Markle; Edward C. Stewart

Archive | 2002

Michael L. Miller; Thomas J. Sonderman; Alexander J. Pasadyn; Richard J. Markle; Brian K. Cusson; Patrick M. Cowan; Timothy L. Jackson; Naomi M. Jenkins

Archive | 2002