Edward C. Stewart
Advanced Micro Devices
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Publication
Featured researches published by Edward C. Stewart.
Design, process integration, and characterization for microelectronics. Conference | 2002
Timothy L. Jackson; Richard J. Markle; Clinton W. Miller; Edward C. Stewart; Robert A. Crowell
We will discuss Advanced Micro Devicess (AMD) Fault Detection and Classification (FDC) program strategy and our six-step project template that we have identified that must be addressed for any successful FDC effort. We will discuss the recent development and implementation of a wafer-level FDC system on a TEL CLEAN TRAC ACT 8 photo track system in AMDs Fab25, a high volume microprocessor factory. We will present our approach to designing and implementing this FDC system and demonstrate its ability to automatically identify specific wafers within a lot that require manual review. Upon manual review, the decision can be made to rework the specific wafers or the lot.
Archive | 2001
Timothy L. Jackson; Richard J. Markle; Edward C. Stewart
Archive | 2005
Edward C. Stewart
Archive | 2002
Edward C. Stewart; Jason A. Grover
Archive | 2005
Edward C. Stewart
Archive | 2005
Susan Hickey; Edward C. Stewart; Jason A. Grover; Cabe W. Nicksic
Archive | 2010
Edward C. Stewart
Archive | 1999
Edward C. Stewart; Curtis Warren Doss; Richard D. Edwards
Archive | 2002
Edward C. Stewart; Susan Hickey
Archive | 2001
Scott Bushman; Anastasia Oshelski Peterson; Edward C. Stewart; Curtis Warren Doss
