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Dive into the research topics where Tokuya Osawa is active.

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Featured researches published by Tokuya Osawa.


IEEE Journal of Solid-state Circuits | 1995

A novel memory cell for multiport RAM on 0.5 /spl mu/m CMOS Sea-of-Gates

Koji Nii; Hideshi Maeno; Tokuya Osawa; Shuuhei Iwade; Shinpei Kayano; Hiroshi Shibata

A novel memory cell circuit for multiport RAM on CMOS Sea-of-Gates (SOG) has been proposed. It contributes to the operation both at high speed and at low voltage. In addition, a fourfold read bit line technique is also proposed to reduce the access time. A multiport RAM generator with the novel memory cell has been developed. 2-port or 3-port RAMs with flexible bit-word configurations are available. Test chips containing seven generated RAMs were designed and fabricated on 0.5 /spl mu/m CMOS SOG. The experimental results of the chip show that each RAM operates at over 1.4 V and that the address access time of the 3-port RAM (16b/spl times/256w) is 4.8 ns at 3.3 V. >


custom integrated circuits conference | 1994

A multi-port RAM generator with novel memory cell for CMOS Sea-of-Gates

Koji Nii; Hideshi Maeno; Tokuya Osawa; Syuuhei Iwade

A multi-port RAM generator for 0.5 /spl mu/m CMOS Sea-of-Gates (SOG) has been developed. 2-port or 3-port RAMs with flexible bit-word configurations are available. In order to operate either at a low supply voltage or at high speed, a novel memory cell circuit is proposed. In addition, a fourfold real bit line technique is adopted to improve access time. The experimental results of the test chips show that each generated RAM operates at over 1.4 V and that the address access time of the 3-port RAM (16 b/spl times/256 w) is 4.8 ns at 3.3 V.<<ETX>>


Archive | 1995

Semiconductor memory testing device

Tokuya Osawa; Hideshi Maeno


Archive | 1982

Semiconductor integrated circuit device with test circuit

Hideshi Maeno; Tokuya Osawa


Archive | 1996

Scan path forming circuit

Tokuya Osawa; Hideshi Maeno


Archive | 1999

Semiconductor integrated circuit device with fault analysis function

Hideshi Maeno; Tokuya Osawa


Archive | 1996

Semiconductor memory device having scan path for testing

Tokuya Osawa; Hideshi Maeno


Proceedings of the IEICE General Conference | 1997

A Proposal of RAM Test Pattern for Pseudo Random Addressing

Tokuya Osawa; Hideshi Maeno; Syuuhei Iwade; Hisanori Hamano


Archive | 1996

Scanning path forming circuit supplying logic circuit as testing circuit

Tokuya Osawa; Hideshi Maeno


custom integrated circuits conference | 1995

A novel memory cell for multiport RAM on 0.5 μm CMOS Sea-of-Gates

Koji Nii; Hideshi Maeno; Tokuya Osawa; Syuuhei Iwade; Shinpei Kayano; H. Shibata

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