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Dive into the research topics where Hideshi Maeno is active.

Publication


Featured researches published by Hideshi Maeno.


IEEE Journal of Solid-state Circuits | 1995

A novel memory cell for multiport RAM on 0.5 /spl mu/m CMOS Sea-of-Gates

Koji Nii; Hideshi Maeno; Tokuya Osawa; Shuuhei Iwade; Shinpei Kayano; Hiroshi Shibata

A novel memory cell circuit for multiport RAM on CMOS Sea-of-Gates (SOG) has been proposed. It contributes to the operation both at high speed and at low voltage. In addition, a fourfold read bit line technique is also proposed to reduce the access time. A multiport RAM generator with the novel memory cell has been developed. 2-port or 3-port RAMs with flexible bit-word configurations are available. Test chips containing seven generated RAMs were designed and fabricated on 0.5 /spl mu/m CMOS SOG. The experimental results of the chip show that each RAM operates at over 1.4 V and that the address access time of the 3-port RAM (16b/spl times/256w) is 4.8 ns at 3.3 V. >


custom integrated circuits conference | 1994

A multi-port RAM generator with novel memory cell for CMOS Sea-of-Gates

Koji Nii; Hideshi Maeno; Tokuya Osawa; Syuuhei Iwade

A multi-port RAM generator for 0.5 /spl mu/m CMOS Sea-of-Gates (SOG) has been developed. 2-port or 3-port RAMs with flexible bit-word configurations are available. In order to operate either at a low supply voltage or at high speed, a novel memory cell circuit is proposed. In addition, a fourfold real bit line technique is adopted to improve access time. The experimental results of the test chips show that each generated RAM operates at over 1.4 V and that the address access time of the 3-port RAM (16 b/spl times/256 w) is 4.8 ns at 3.3 V.<<ETX>>


Archive | 1995

Semiconductor memory testing device

Tokuya Osawa; Hideshi Maeno


Archive | 1996

Flip-flop circuit, scan path and storage circuit

Hideshi Maeno


Archive | 1999

Electronic system with self-test function and simulation circuit for electronic system

Hideshi Maeno


Archive | 1989

Semiconductor memory device having serial addressing and operating method thereof

Hideshi Maeno


Archive | 1998

Method and device for testing content addressable memory circuit and content addressable memory circuit with redundancy function

Hideshi Maeno


Archive | 1986

Testing apparatus for semiconductor device

Tetsuo Tada; Hideshi Maeno


Archive | 1998

Pseudo-random number generating circuit and bidirectional shift register

Hideshi Maeno


Archive | 1997

Semiconductor integrated circuit device having multi-port RAM memory with random logic portion which can be tested without additional test circuitry

Hideshi Maeno

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