Tom Pardini

Effect of slope errors on the performance of mirrors for x-ray free electron laser applications.

In this work we point out that slope errors play only a minor role in the performance of a certain class of x-ray optics for X-ray Free Electron Laser (XFEL) applications. Using physical optics propagation simulations and the formalism of Church and Takacs [Opt. Eng. 34, 353 (1995)], we show that diffraction limited optics commonly found at XFEL facilities posses a critical spatial wavelength that makes them less sensitive to slope errors, and more sensitive to height error. Given the number of XFELs currently operating or under construction across the world, we hope that this simple observation will help to correctly define specifications for x-ray optics to be deployed at XFELs, possibly reducing the budget and the timeframe needed to complete the optical manufacturing and metrology.

Optical and multilayer design for the first Kirkpatrick-Baez optics for x-ray diagnostic at NIF

At the Lawrence Livermore National Laboratory (LLNL) we are designing, developing and testing multiple Kirkpatrick-Baez (KB) optics to be added to the suite of x-ray diagnostic instruments for the National Ignition Facility (NIF). Each optic consists of four KB channels made of spherically super-polished x-ray substrates. These substrates are multilayer-coated to allow steep grazing angle geometry and wavelength filtering. These optics are customized for different experiments and will provide NIF with an alternative x-ray imaging technique to pinholes, improving both resolution and photon throughput. With this manuscript we describe KB optic requirements, specifications, optical and multilayer designs.

Calibration results for first NIF Kirkpatrick-Baez microscope

The Lawrence Livermore National Laboratory (LLNL) has been developing a novel X-ray imager for the National Ignition Facility (NIF) utilizing Kirkpatrick-Baez (KB) mirror geometry. A fully assembled mirror pack contains four KB optic pairs featuring cylindrical mirrors with custom-designed multilayer coatings. Multiple interchangeable mirror packs have been commissioned for various experimental campaigns, with high spatial resolution (< 5 μm) at the center of the field of view and 12× magnification. Tight tolerances on the grazing angles of the X-ray mirrors require precision alignment and assembly of each component via a coordinate measuring machine, and a comprehensive off-line calibration of the four KB channels at X-ray wavelengths. The main goals of the calibration campaign are to measure the performance of the multilayer, validate the assembly procedure by measuring the as-built spatial resolution and determine the best object to mirror pack distance (drive depth) of the microscope for fielding at NIF. We report on the results of this effort on the first fully assembled NIF KB X-ray imager.

Resolution extension by image summing in serial femtosecond crystallography of two-dimensional membrane-protein crystals

The resolution limit of serial diffraction from two-dimensional crystals at a free-electron laser was extended to the detector edge (4 Å) by exploiting the large redundancy of the data set.

Numerical simulations of the hard X-ray pulse intensity distribution at the Linac Coherent Light Source

Numerical simulations of the current and future pulse intensity distributions at selected locations along the hard X-ray section of the Linac Coherent Light Source are provided. Estimates are given for the pulse fluence, energy and size in and out of focus, taking into account effects due to the experimentally measured divergences of the X-ray beam, and measured figure errors of all X-ray optics in the beam path.

The MEL-X project at the Lawrence Livermore National Laboratory: a mirror-based delay line for x-rays

At the Lawrence Livermore National Laboratory (LLNL) in collaboration with the Linac Coherent Light Source (LCLS) we are developing a mirror-based delay line for x-rays (MEL-X) to enable x-ray pump/x-ray probe experiments at Free Electron Lasers (XFELs). The goal of this project is the development and deployment of a proof-of-principle delay line featuring coated x-ray optics. The four-mirror design of the MEL-X is motivated by the need for ease of alignment and use. In order to simplify the overlap of the pump and the probe beam after each delay time change, a scheme involving super-polished rails and mirror-to-motor decoupling has been adopted. The MEL-X, used in combination with a bright pulsed source like LCLS, features a capability for a high intensity pump beam. Its Iridium coating allows it to work at hard x-ray energies all the way up to 9 keV, with a probe beam transmission of 35% up to 8keV, and 14% at 9keV. The delay time can be tailored to each particular experiment, with a nominal range of 70 - 350 fs for this prototype. The MEL-X, combined with established techniques such as x-ray diffraction, absorption or emission, could provide new insights on ultra-fast transitions in highly excited states of matter.

The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation

The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.

Aperiodic Mo/Si multilayers for hard x-rays

In this work we have developed aperiodic Molybdenum/Silicon (Mo/Si) multilayers (MLs) to reflect 16.25 keV photons at a grazing angle of incidence of 0.6° ± 0.05°. To the best of our knowledge this is the first time this material system has been used to fabricate aperiodic MLs for hard x-rays. At these energies new hurdles arise. First of all a large number of bilayers is required to reach saturation. This poses a challenge from the manufacturing point of view, as thickness control of each ML period becomes paramount. The latter is not well defined a priori, due to the thickness of the interfacial silicide layers which has been observed to vary as a function of Mo and Si thickness. Additionally an amorphous-to-crystalline transition for Mo must be avoided in order maintain reasonably low roughness at the interfaces. This transition is well within the range of thicknesses pertinent to this study. Despite these difficulties our data demonstrates that we achieved reasonably flat ML response across the angular acceptance of ± 0.05°, with an experimentally confirmed average reflectivity of 28%. Such a ML prescription is well suited for applications in the field of hard x-ray imaging of highly diverging sources.

Silicon single crystal as back-reflector for high-intensity hard x-rays

At the Lawrence Livermore National Laboratory (LLNL) we have engineered a silicon prototype sample that can be used to reflect focused hard x-ray photons at high intensities in back-scattering geometry.1 Our work is motivated by the need for an all-x-ray pump-and-probe capability at X-ray Free Electron Lasers (XFELs) such as the Linac Coherent Light Source (LCSL) at SLAC. In the first phase of our project, we exposed silicon single crystal to the LCLS beam, and quantitatively studied the x-ray induced damage as a function of x-ray fluence. The damage we observed is extensive at fluences typical of pump-and-probe experiments. The conclusions drawn from our data allowed us to design and manufacture a silicon mirror that can limit the local damage, and reflect the incident beam before its single crystal structure is destroyed. In the second phase of this project we tested this prototype back-reflector at the LCLS. Preliminary results suggest that the new mirror geometry yields reproducible Bragg reflectivity at high x-ray fluences, promising a path forward for silicon single crystals as x-ray back-reflectors.