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Tsuyoshi Hasegawa

Hitachi

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Publication

Featured researches published by Tsuyoshi Hasegawa.

Archive | 2003

Scanning probe microscope and specimen surface structure measuring method

Tsuyoshi Hasegawa; Masakazu Aono; Tomonobu Nakayama; Sumio Hosaka

Archive | 1991

Scanning tunneling microscope and surface topographic observation method

Sumio Hosaka; Shigeyuki Hosoki; Keiji Takata; Tsuyoshi Hasegawa

Meeting Abstracts | 2012

Atom Movement Controlled Devices: Atomic Switches and Atom Transistor

Tsuyoshi Hasegawa; Masakazu Aono

Archive | 2010

Structural characterization of amorphous Ta[sub 2]O[sub 5] and SiO[sub 2]–Ta[sub 2]O[sub 5] used as solid electrolyte for nonvolatile switches

Naoki Banno; Toshitsugu Sakamoto; Noriyuki Iguchi; Masashi Matsumoto; Hideto Imai; Toshinari Ichihashi; Shinji Fujieda; Kazuhiko Tanaka; Satoshi Watanabe; Shu Yamaguchi; Tsuyoshi Hasegawa; Masakazu Aono

Archive | 2003

Festelektrolyt-schaltelemente, fpga- und speicherbauelemente mit denselben sowie verfahren zur herstellung derselben

Toshitsugu Sakamoto; Masakazu Aono; Tsuyoshi Hasegawa; Tomonobu Nakayama; Hiroshi Sunamura; Hisao Kawaura; Naohiko Sugibayashi

Archive | 2003

Schalteinrichtung mit festelektrolyt, fpga damit, speicherbaustein und verfahren zur herstellung einer schalteinrichtung mit festelektrolyt

Masakazu Aono; Tsuyoshi Hasegawa; Hisao Kawaura; Tomonobu Nakayama; Toshitsugu Sakamoto; Naohiko Sugibayashi; Hiroshi Sunamura

Archive | 1994

Vorrichtung zur Bestimmung von physikalischen Eigenschaften eines Mikrogebiets Apparatus for determining physical properties of a micro area

Shigeyuki Hosoki; Tsuyoshi Hasegawa; Makiko Kohno

Archive | 1994

Apparatus for determining physical properties of a micro area

Shigeyuki Hosoki; Tsuyoshi Hasegawa; Makiko Kohno

Archive | 1993

Verfahren und Vorrichtung zum Beobachten einer Fläche Method and apparatus for observing a surface

Sumio Hosaka; Atsushi Kikugawa; Yukio Honda; Hajime Koyanagi; Shigeyuki Hosoki; Tsuyoshi Hasegawa

Archive | 1990

Oberflächenmikroskop. A surface microscope.

Sumio Hosaka; Shigeyuki Hosoki; Tsuyoshi Hasegawa

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Collaboration

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Shigeyuki Hosoki

Hitachi

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Sumio Hosaka

Hitachi Construction Machinery

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Masakazu Aono

NEC

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Keiji Takata

Hitachi

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Toshitsugu Sakamoto

NEC

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Tomonobu Nakayama

École Polytechnique Fédérale de Lausanne

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Hiroshi Sunamura

NEC

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Hisao Kawaura

NEC

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Makiko Kohno

Hitachi

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Kazuhiko Tanaka

University of Tokyo

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