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Publication
Featured researches published by William Paul Hovis.
international solid-state circuits conference | 1990
Howard Leo Kalter; John E. Barth; J. Dilorenzo; Charles Edward Drake; John A. Fifield; William Paul Hovis; Gordon Arthur Kelley; Scott C. Lewis; J. Nickel; Charles H. Stapper; James Andrew Yankosky
A 16-Mb DRAM chip fabricated in a 0.5- mu m CMOS process using silicided polysilicon, double metal, and trench storage is described. It incorporates an architecture that supports either 11/11 or 12/10 RAS/CAS (row-address strobe/column-address-strobe) addressing. It is segmented to utilize bit redundancy of 2 lines/137-b lines/half quadrant, and separate word-redundant array of 24 lines/quadrant, providing any-for-any-word-line replacement within a quadrant. It has single-error-correct/double-error-detect (SEC/DED) error checking and correcting (ECC) Hamming odd-weight code/quadrant and either 5-V or 3-V operation. The design provides a RAS access of 50 ns with 16-ns fast-page access, 18-ns static column or toggle of 10 ns at 2.9 V and 85 degrees C. DRAM features are summarized.<<ETX>>
Archive | 2004
Richard Lee Donze; William Paul Hovis; Terrance Wayne Kueper; Edward Sheets Ii John; Jon Robert Tetzloff
Archive | 2004
Richard Lee Donze; Karl R. Erickson; William Paul Hovis; John E. Sheets Ii; Jon Robert Tetzloff; Laura Marie Zumbrunnen
Archive | 1991
John E. Barth; Charles Edward Drake; John A. Fifield; William Paul Hovis; Howard Leo Kalter; Scott C. Lewis; Daniel John Nickel; Charles H. Stapper; James Andrew Yankosky
Archive | 1996
William Paul Hovis; Kent Harold Haselhorst; Steven Wayne Kerchberger; Jeffrey Douglas Brown; David A. Luick
Archive | 2008
Roger A. Booth; William Paul Hovis; Jack A. Mandelman
Archive | 1999
William Paul Hovis
Archive | 2004
William Hugh Cochran; William Paul Hovis; Paul Rudrud
Archive | 2004
Gerald Keith Bartley; John Michael Borkenhagen; William Hugh Cochran; William Paul Hovis; Paul Rudrud
Archive | 2008
Philip Rogers Hillier; William Paul Hovis; Joseph A. Kirscht