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Dive into the research topics where Charles Edward Drake is active.

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Featured researches published by Charles Edward Drake.


international solid-state circuits conference | 1996

A 1 MB, 100 MHz integrated L2 cache memory with 128b interface and ECC protection

G. Giacalone; R. Busch; F. Creed; A. Davidovich; S. Divakaruni; Charles Edward Drake; C. Ematrudo; John A. Fifield; M. Hodges; W. Howell; P. Jenkins; M. Kozyrczak; C. Miller; T. Obremski; C. Reed; G. Rohrbaugh; M. Vincent; T. von Reyn; Jeffrey S. Zimmerman

Several cache-DRAMs have been reported, but all require multiple chips to implement an L2 cache system. The advent of 20 ns, 16 Mb DRAM technology has made a high-speed single-chip 1MB cache possible, replacing multiple SRAM and logic modules, saving board space and reducing power. Multichip-module (MCM) packaging further optimizes the electrical characteristics of the processor-cache connection. An in-line level-2 1 MB cache chip that has DRAM density contains high-speed SRAM and MCM technology.


international solid-state circuits conference | 1990

A 50 ns 16 Mb DRAM with a 10 ns data rate

Howard Leo Kalter; John E. Barth; J. Dilorenzo; Charles Edward Drake; John A. Fifield; William Paul Hovis; Gordon Arthur Kelley; Scott C. Lewis; J. Nickel; Charles H. Stapper; James Andrew Yankosky

A 16-Mb DRAM chip fabricated in a 0.5- mu m CMOS process using silicided polysilicon, double metal, and trench storage is described. It incorporates an architecture that supports either 11/11 or 12/10 RAS/CAS (row-address strobe/column-address-strobe) addressing. It is segmented to utilize bit redundancy of 2 lines/137-b lines/half quadrant, and separate word-redundant array of 24 lines/quadrant, providing any-for-any-word-line replacement within a quadrant. It has single-error-correct/double-error-detect (SEC/DED) error checking and correcting (ECC) Hamming odd-weight code/quadrant and either 5-V or 3-V operation. The design provides a RAS access of 50 ns with 16-ns fast-page access, 18-ns static column or toggle of 10 ns at 2.9 V and 85 degrees C. DRAM features are summarized.<<ETX>>


Archive | 1991

Dynamic RAM with on-chip ECC and optimized bit and word redundancy

John E. Barth; Charles Edward Drake; John A. Fifield; William Paul Hovis; Howard Leo Kalter; Scott C. Lewis; Daniel John Nickel; Charles H. Stapper; James Andrew Yankosky


Archive | 1995

Memory system reset circuit

Claude L. Bertin; Charles Edward Drake; John A. Fifield; Erik L. Hedberg


Archive | 1994

On-chip ECC status

Charles Edward Drake; John A. Fifield; Richard D. Wheeler; Barry Joe Wolford


Archive | 1995

Partitioned dynamic memory allowing substitution of a redundant circuit in any partition and using partial address disablement and disablement override

Mark Beiley; Charles Edward Drake; Thomas E. Obremski


Archive | 1996

High performance redundancy in an integrated memory system

Francis Anthony Creed; Mark Beiley; Charles Edward Drake; Peter Joel Jenkins


Archive | 1991

Low power addressing systems

John E. Barth; Charles Edward Drake; William Paul Hovis; Howard Leo Kalter; Gordon Arthur Kelley; Scott C. Lewis; Daniel John Nickel; James Andrew Yankosky


Archive | 1996

SP 23.2: A lMB, lOOMHt Integrated L2 Cache Memory with 128b Interface and ECC Protection

Glenn Peter Giacalone; Robert E. Busch; Frank Creed; Alex Davidovich; Charles Edward Drake; Christopher Ematrudo; John A. Fifield; Wayne J. Howell; Peter Joel Jenkins; Maciek Kozyrczak; Thomas E. Obremski; Charlotte Reed; George Rohrbaugh


Archive | 1991

Addressing devices with low power

John E. Barth; Charles Edward Drake; William Paul Hovis; Howard Leo Kalter; Gordon Arthur Kelley; Scott C. Lewis; Daniel John Nickel; James Andrew Yankosky

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