Won-Je Park
Samsung
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international solid-state circuits conference | 2014
Jung-Chak Ahn; Kyung-Ho Lee; Yi-tae Kim; Hee-Geun Jeong; Bum-Suk Kim; Hong-ki Kim; Jong-Eun Park; Taesub Jung; Won-Je Park; Taeheon Lee; Eun-Kyung Park; Sangjun Choi; Gyehun Choi; Haeyong Park; Yujung Choi; Seungwook Lee; Yun-kyung Kim; Y. Jay Jung; D.I. Park; Seungjoo Nah; Young-Sun Oh; Mi-Hye Kim; Yooseung Lee; Youngwoo Chung; Ihara Hisanori; Joonhyuk Im; Daniel K. J. Lee; Byung-hyun Yim; Gidoo Lee; Heesang Kown
According to the trend towards high-resolution CMOS image sensors, pixel sizes are continuously shrinking, towards and below 1.0μm, and sizes are now reaching a technological limit to meet required SNR performance [1-2]. SNR at low-light conditions, which is a key performance metric, is determined by the sensitivity and crosstalk in pixels. To improve sensitivity, pixel technology has migrated from frontside illumination (FSI) to backside illumiation (BSI) as pixel size shrinks down. In BSI technology, it is very difficult to further increase the sensitivity in a pixel of near-1.0μm size because there are no structural obstacles for incident light from micro-lens to photodiode. Therefore the only way to improve low-light SNR is to reduce crosstalk, which makes the non-diagonal elements of the color-correction matrix (CCM) close to zero and thus reduces color noise [3]. The best way to improve crosstalk is to introduce a complete physical isolation between neighboring pixels, e.g., using deep-trench isolation (DTI). So far, a few attempts using DTI have been made to suppress silicon crosstalk. A backside DTI in as small as 1.12μm-pixel, which is formed in the BSI process, is reported in [4], but it is just an intermediate step in the DTI-related technology because it cannot completely prevent silicon crosstalk, especially for long wavelengths of light. On the other hand, front-side DTIs for FSI pixels [5] and BSI pixels [6] are reported. In [5], however, DTI is present not only along the periphery of each pixel, but also invades into the pixel so that it is inefficient in terms of gathering incident light and providing sufficient amount of photodiode area. In [6], the pixel size is as large as 2.0μm and it is hard to scale down with this technology for near 1.0μm pitch because DTI width imposes a critical limit on the sufficient amount of photodiode area for full-well capacity. Thus, a new technological advance is necessary to realize the ideal front DTI in a small size pixel near 1.0μm.
Archive | 2008
Young-hoon Park; Jae-Ho Song; Won-Je Park; Jin-hyeong Park; Jeong-Hoon Bae; Jung-Ho Park
Archive | 2011
Won-Je Park; Chan Park; Young-hoon Park; Jae-Ho Song; Jong-Wook Hong; Keo-sung Park
Archive | 2006
Young-hoon Park; Won-Je Park; Tae-Seok Oh; Jae-Ho Song
Archive | 2006
Young-hoon Park; Jae-Ho Song; Won-Je Park
Archive | 2009
Won-Je Park; Young-hoon Park; Ui-Sik Kim; Dae-cheol Seong; Yeo-Ju Yoon; Bo-Bae Keang
Archive | 2008
Jeong-Hoon Bae; Tae-Seok Oh; Ki-Hong Kim; Hyoun-Min Baek; Won-Je Park; Jung-Ho Park
Archive | 2006
Won-Je Park
Archive | 2009
Ui-Sik Kim; Young-hoon Park; Won-Je Park; Dae-cheol Seong; Yeo-Ju Yoon; Bo-Bae Kang
Archive | 2007
Jong-Wook Hong; Tae-Seok Oh; Duk-min Yi; Young-Mook Oh; Won-Je Park