Gi-jung Kim

Method of fabricating semiconductor wafer

Methods of treating crystal-grown wafers for surface defect analysis

Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination and methods of forming same

Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements

Semiconductor wafers having asymmetric edge profiles that facilitate high yield processing by inhibiting particulate contamination

3D CMOS Image Sensors, Sensor Systems Including the Same

Gettering structures and methods and their application

Polishing pad of a chemical mechanical polishing apparatus and method of manufacturing the same

Wafer carrier for minimizing contacting area with wafers

Semiconductor wafer having identification indication