Xiaohong Quan
Qualcomm
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Publication
Featured researches published by Xiaohong Quan.
Microelectronics Reliability | 2016
Ankit Srivastava; Gene Worley; Xiaohong Quan; Guoqing Miao
Abstract The standard ESD protection schemes are not very reliable for negative charge pump used in Class G power amplifiers. This work presents a novel ESD protection scheme using internal charge pump switches as ESD clamps. Transmission line pulsing (TLP) measurements show that an elevated level of ESD protection can be achieved with this scheme.
Archive | 2011
Ankit Srivastava; Eugene R. Worley; Guoqing Miao; Xiaohong Quan
Archive | 2012
Xiaohong Quan; Ankit Srivastava; Guoqing Miao
Archive | 2013
Xiaohong Quan; Peter Jivan Shah; Ankit Srivastava; Guoqing Miao
Archive | 2012
Ankit Srivastava; Matthew D. Sienko; Meysam Azin; Xiaohong Quan; Peter Jivan Shah
Archive | 2010
Ankit Srivastava; Xiaohong Quan
Archive | 2011
Ankit Srivastava; Xuhao Huang; Xiaohong Quan
Archive | 2013
Xuhao Huang; Ankit Srivastava; Xiaohong Quan; Seyfollah Bazarjani
Archive | 2012
Ankit Srivastava; Xuhao Huang; Xiaohong Quan
Archive | 2012
Xiaohong Quan; Ankit Srivastava
