Ying-Chieh Wang

InGaN/GaN single-quantum-well microdisks

We have grown In{sub x}Ga{sub 1-x}N/GaN quantum wells atop GaN microdisk with {gamma}-LiAlO{sub 2} substrate by using plasma-assisted molecular beam epitaxy. The structural and optical properties of the samples were analyzed by transmission electron microscopy, x-ray diffraction, cathodoluminescence, and photoluminescence measurements. Based on the measured results, we obtained the indium concentration of the In{sub x}Ga{sub 1-x}N/GaN single quantum well to be x = 0.25 with a band-gap energy of 2.31 eV, which is consistent with the bowing effect of bulk In{sub x}Ga{sub 1-x}N: E{sub g}(x) = [3.42 - x * 2.65 - x * (1 - x) * 2.4] eV.

Green light emission by InGaN/GaN multiple-quantum-well microdisks

The high-quality In{sub x}Ga{sub 1−x}N/GaN multiple quantum wells were grown on GaN microdisks with γ-LiAlO{sub 2} substrate by using low-temperature two-step technique of plasma-assisted molecular beam epitaxy. We demonstrated that the hexagonal GaN microdisk can be used as a strain-free substrate to grow the advanced In{sub x}Ga{sub 1−x}N/GaN quantum wells for the optoelectronic applications. We showed that the green light of 566-nm wavelength (2.192 eV) emitted from the In{sub x}Ga{sub 1−x}N/GaN quantum wells was tremendously enhanced in an order of amplitude higher than the UV light of 367-nm wavelength (3.383 eV) from GaN.

Self-confined GaN heterophased quantum wells

Wurtzite/zinc-blende/wurtzite GaN heterophased quantum wells (QWs) were grown by plasma-assisted molecular beam epitaxy. A self-assembling mechanism was used to simulate the heterophased QW, in which a wurtzite/zinc-blende phase transition was created by rotating the threefold symmetric N-Ga vertical bond 60°. The GaN heterophased QW was attested by transmission electron microscopy, selective area electron diffraction and cathodoluminescence measurements.

Electrical contact for wurtzite GaN microdisks

We developed a back processing to fabricate an electrical contact of wurtzite GaN microdisk on transparent p-type GaN template. The interface welding between the GaN microdisk and p-type GaN template produced a very solid and secure epi-film contact for the electrical current passing through, with a resistance of 45.0 KΩ and threshold voltage of 5.9 V. The back processing can resolve the obstacle of electrical contacts for self-assembled wurtzite nano-devices.

Growth of InGaN/GaN quantum wells with graded InGaN buffer for green-to-yellow light emitters

We have studied the growth of high-indium-content In x Ga1− x N/GaN double quantum wells (QWs) for yellow and green light emitters by plasma-assisted molecular beam epitaxy at a low substrate temperature (570 °C). By introducing a graded In y Ga1− y N buffer layer, the PL intensity of QWs can be increased sixfold compared with that of the original structure. In addition, the indium content in InGaN QWs was increased owing the prolonged growth time of the graded In y Ga1− y N buffer layer. After adjusting to optimal growth conditions, we achieved In x Ga1− x N/GaN QWs with x = 0.32. Photoluminescence measurements showed that the emission wavelength from In x Ga1− x N/GaN QWs was 560 nm (2.20 eV). The optimal condition for the gradient In y Ga1− y N buffer layer was obtained for light emission from green to yellow.

Finite growth of InGaN/GaN triple-quantum-well microdisks on LiAlO2 substrate

We have grown high-quality InxGa1-xN/GaN triple-quantum-well microdisks on LiAlO2 substrate by plasma-assisted molecular beam epitaxy. The InxGa1-xN/GaN microdisk with a hexagonal shape of oblique face 28o-angle off c-axis was achieved. The mechanism of the termination of awl-shaped growth and the growth rates of GaN-barrier and InxGa1-xN-well were evaluated and confirmed with the triple quantum wells. Based on the growth rates and 28o-angle geometric shape, one can control the finite size of InGaN/GaN microdisks by plasma-assisted molecular beam epitaxy.