Yoshiaki Okuyama

Semiconductor memory and burn-in test method of semiconductor memory

Semiconductor memory having burst transfer function and internal refresh function

Semiconductor memory having test function for refresh operation

Semiconductor memory, operating method of semiconductor memory, memory controller, and system

Semiconductor memory device having a self-refresh operation

Semiconductor memory automatically carrying out refresh operation

Semiconductor memory apparatus simultaneously accessible via multi-ports

Semiconductor memory device with reduced current consumption

Semiconductor memory and testing method of same

Semiconductor memory and method of operating same