Nobumi Kodama

Semiconductor integrated circuit having function for switching operational mode of internal circuit

Semiconductor memory and burn-in test method of semiconductor memory

Semiconductor dynamic memory device having improved refreshing

Semiconductor memory device having a circuit for compensating for discriminating voltage of memory cells

Semiconductor memory device with a detection circuit to detect word line potential

Semiconductor memory device having common driver circuits for plural memory cell arrays

Semiconductor memory device having a circuit for compensating for discriminating voltage variations of a memory cell

Semiconductor memory and preburning test method of semiconductor memory

Spannungserhoeherschaltung. Voltage boost circuit.

to compensate for the semiconductor memory device with a circuit to diskriminierspannungsveraenderungen a memory cell.