Yoshiya Iide

Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity

We designed logic cells hardened for single-event upsets/single-event transients (SEUs/SETs) using hardness-by-design (HBD) methodology on OKIs 0.15 /spl mu/m fully depleted complementary metal-oxide-semiconductor/silicon-on-insulator (CMOS/SOI) commercial process and evaluated the sample devices. Our previous work demonstrates that SET-free inverters can be successfully applied as SEU-immune latches. In this paper, the native latches are redesigned using SET-free inverters not only for the inverter loop but also for several types of clock gates (L-SETfree-LoopCK, L-SETfree-LoopCK-SmallArea, and L-SETfree-LoopCK-AddTr.). In addition, the native combinational logic cells are redesigned using SET-free inverters as SET-free NAND and SET-free NOR . Excellent SEU/SET hardness of the HBD latches were achieved up to LET of 64 MeV/(mg/cm/sup 2/).

Single-event effects in 0.18 /spl mu/m CMOS commercial processes

We evaluated SEEs in sample circuits fabricated at TSMC and Fujitsu with their 0.18 /spl mu/m CMOS commercial processes. The samples were designed with hardness-by-design methodology. The results were discussed for effective hardening design associated with SEEs.

Terrestrial neutron-induced single-event burnout in SiC power diodes

Tolerance against single-event burnout (SEB) caused by terrestrial neutrons is one of the urgent issues in practical application of SiC power devices. This paper presents evaluation results of neutron-induced SEB in SiC power diodes and differences between SiC and Si devices from the SEB standpoint.

SEE in a 0.15 /spl mu/m fully depleted CMOS/SOI commercial Process

We evaluated single-event effects (SEEs) in test circuits fabricated at OKI with their 0.15 /spl mu/m Fully Depleted CMOS/SOI commercial process. The sample devices were designed with hardness-by design (HBD) methodology. The results are discussed for an effective hardening design associated with SEEs.

Correlation between proton and heavy-ion SEUs in commercial memory devices

Proton and heavy-ion SEU testing are performed on commercial 4 M bit-SRAMs and 64M bit-DRAMs. Correlation between proton and heavy-ion SEUs is examined and an empirical equation has been derived between proton SEU cross-section and heavy-ion threshold-LET.

Design and development status of the EarthCARE Cloud Profiling Radar

The Cloud Profiling Radar (CPR) for the EarthCARE mission has been jointly developed by JAXA and NICT in Japan. The CPR is a millimeter-wave radar which has a large deployable antenna and its unique feature is vertical Doppler velocity measurement capability. The Engineering Model development and testing are now ongoing and the predicted performance will be verified after a series of tests. This paper will present the latest design and development status of the EarthCARE CPR.

EarthCARE/CPR design results and PFM performance

ESA and JAXA plan to launch a satellite called EarthCARE (Earth Clouds, Aerosols and Radiation Explorer). The Cloud Profiling Radar (CPR), which will be the first millimeter-wave Doppler radar in space, is installed on this satellite as one of main sensors to observe clouds. This paper describes the design results and PFM performance of EarthCARE CPR.