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Dive into the research topics where Young Jun Ku is active.

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Featured researches published by Young Jun Ku.


international solid-state circuits conference | 2016

18.3 A 1.2V 64Gb 8-channel 256GB/s HBM DRAM with peripheral-base-die architecture and small-swing technique on heavy load interface

Jong Chern Lee; Jihwan Kim; Kyung Whan Kim; Young Jun Ku; Dae Suk Kim; Chun-Seok Jeong; Tae Sik Yun; Hong-Jung Kim; Ho Sung Cho; Yeon Ok Kim; Jae Hwan Kim; Jin Ho Kim; Sangmuk Oh; Hyun-sung Lee; Ki Hun Kwon; Dong Beom Lee; Young Jae Choi; Jeajin Lee; Hyeon Gon Kim; Jun Hyun Chun; Jonghoon Oh; Seok-Hee Lee

Because of the expansion of high performance computing (HPC) and server market, demand for HBM DRAM is increasing. With this market flow, diverse customers require various HBM product families. One customer requirement is full bandwidth with less density. Therefore, this work presents a HBM DRAM, which supports 4, 8, and even 2-hi stacks with full-bandwidth performance. The HBM DRAM adopts a peripheral base die architecture, which has smaller chip size and good testability resulting in more manufacturability. This architecture can compensate for process variation, since this problem among core dies within the same known good stacked die (KGSD) is the key issue of TSV-based stacked DRAM [1]. Layout aligning between PHY and TSVs improves the speed performance of the whole system due to reduced data skew. The peripheral base die contains address/command decoders (COMDEC), a core pipe-out (POUT) signal generator, and internal power, references and bias generators. A small-swing technique on a heavy load interface can reduce dynamic power and also has tolerance to process variations.


international soc design conference | 2016

High bandwidth memory(HBM) with TSV technique

Jong Chern Lee; Jihwan Kim; Kyung Whan Kim; Young Jun Ku; Dae Suk Kim; Chun-Seok Jeong; Tae Sik Yun; Hong-Jung Kim; Ho Sung Cho; Sangmuk Oh; Hyun-sung Lee; Ki Hun Kwon; Dong Beom Lee; Young Jae Choi; Jae-Jin Lee; Hyeon Gon Kim; Jun Hyun Chun; Jonghoon Oh; Seok-Hee Lee

In this paper, HBM DRAM with TSV technique is introduced. This paper covers the general TSV feature and techniques such as TSV architecture, TSV reliability, TSV open / short test, and TSV repair. And HBM DRAM, representative DRAM product using TSV, is widely presented, especially the use and features.


asian solid state circuits conference | 2011

A low-power small-area open loop digital DLL for 2.2Gb/s/pin 2Gb DDR3 SDRAM

Jong-Chern Lee; Sin-Hyun Jin; Dae-Suk Kim; Young Jun Ku; Chul Kim; Byung-Kwon Park; Hong-gyeom Kim; Seong-Jun Ahn; Jae-Jin Lee; Sung-Joo Hong

This paper presents a low-power small-area open loop digital DLL. The DLL has open loop single replica block with duty cycle corrector (DCC), clock divider, pulse generator, 10-bit counter, and delay line. The DLL used for 2.2Gb/s/pin 2Gb DDR3 SDRAM is fabricated using 44nm DRAM Process. Experimental results show 1.1GHz operation frequency at 1.5V, and the measured total power and area savings in comparison with the conventional closed-loop operation is about 93.5% and 90.7% respectively.


Archive | 2009

Circuit and method for testing semiconductor apparatus

Min Seok Choi; Jong Chern Lee; Sang Jin Byeon; Young Jun Ku


Archive | 2012

THREE-DIMENSIONAL STACKED SEMICONDUCTOR INTEGRATED CIRCUIT AND TSV REPAIR METHOD THEREOF

Min Seok Choi; Sang Jin Byeon; Young Jun Ku


Archive | 2011

DATA TRANSMISSION CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

Young Jun Ku


Archive | 2010

Repair circuit and semiconductor apparatus including the same

Min Seok Choi; Young Jun Ku


Archive | 2014

Stacked semiconductor apparatus and semiconductor system capable of inputting signals through various paths

Sang Jin Byeon; Jae Bum Ko; Young Jun Ku


Archive | 2010

THREE-DIMENSIONAL STACKED SEMICONDUCTOR INTEGRATED CIRCUIT

Tae Sik Yun; Young Jun Ku


Archive | 2015

SEMICONDUCTOR APPARATUS AND SYSTEM CAPABLE OF REDUCING PEAK CURRENT IN TRANSMITTING SIGNALS

Min su Park; Young Jun Ku

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