Sang Jin Byeon
SK Hynix
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Publication
Featured researches published by Sang Jin Byeon.
IEEE Journal of Solid-state Circuits | 2015
Dong Uk Lee; Kyung Whan Kim; Kwan Weon Kim; Kang Seol Lee; Sang Jin Byeon; Jae Hwan Kim; Jin Hee Cho; Jae-Jin Lee; Jun Hyun Chun
Motivated by a graphics memory system that achieves multiplied bandwidth by the number of memories per system, HBM DRAM adopts a brand new architecture, with many technical changes and challenges. The first main change in the architecture is the stacked memory structure with TSV array, which has independent bandwidth per slice. The second is semi-independent row, column command interface, which enhances effective performance. For supporting high bandwidth, this chip has fine pitch microbump interface. Methods for testing microbump are explained. 8 Gb stacked HBM is fabricated with chip-on-wafer process and tested with high-frequency wafer probing. Using chip-on-wafer test results, 128 GB/s at 1.2 V supply voltage is achieved.
symposium on vlsi circuits | 2014
Dong Uk Lee; Kyung Whan Kim; Kwan Weon Kim; Kang Seol Lee; Sang Jin Byeon; Jin Hee Cho; Han Ho Jin; Sang Kyun Nam; Jae-Jin Lee; Jun Hyun Chun; Sung-Joo Hong
For the heterogeneous-structured high bandwidth memory (HBM) DRAM, it is important to guarantee the reliability of TSV connections. An exact TSV current scan and repair method is proposed, that uses similar to the correlated double sampling method. The register-based pre-repair method improves testability. The measurement results for thousands of TSV shows impedance distribution under 0.1 ohm. Methods are integrated in 8Gb HBM stacked DRAM using 29nm process.
Archive | 2009
Min Seok Choi; Jong Chern Lee; Sang Jin Byeon; Young Jun Ku
Archive | 2012
Min Seok Choi; Sang Jin Byeon; Young Jun Ku
Archive | 2012
Tae Sik Yun; Hyung Dong Lee; Jun Gi Choi; Sang Jin Byeon; Sang Hoon Shin
Archive | 2012
Sin Hyun Jin; Sang Jin Byeon
Archive | 2008
Sang Jin Byeon
Archive | 2013
Sang Jin Byeon; Kee Teok Park
Archive | 2010
Sang Jin Byeon
Archive | 2010
Sang Jin Byeon