Z.J. Li
University of Electronic Science and Technology of China
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Publication
Featured researches published by Z.J. Li.
IEEE Transactions on Circuits and Systems Ii-express Briefs | 2013
Xi Qu; Zekun Zhou; Bo Zhang; Z.J. Li
An output capacitor-free low-dropout regulator (LDO) using a class-AB operational amplifier and an assistant push–pull output stage (APPOS) circuit to enable fast-transient response with ultralow-power dissipation is presented in this brief. The APPOS circuit is proposed to deliver an extra current that is directly proportional to the output current of the class-AB operational amplifier during transient state with an automatic on/off feature. Moreover, the small-signal and large-signal responses of LDO can be separately optimized. As a result, transient performances of LDO are improved significantly without requiring an area-consuming on-chip capacitor anymore. The proposed LDO has been implemented in a standard 0.35-<formula formulatype=inline><tex Notation=TeX>
international conference on electron devices and solid-state circuits | 2009
Zekun Zhou; Zhi Huang; Xing Ming; Bo Zhang; Z.J. Li
muhbox{m}
international conference on electron devices and solid-state circuits | 2009
Lijuan Wu; Shengdong Hu; Bo Zhang; Z.J. Li
</tex></formula> CMOS process. Experimental results show that the LDO can regulate the output voltage at 1.0 V from a 1.2-V supply voltage for the maximum load current of 100 mA. The output voltage fully recovers within 2.7 <formula formulatype=inline><tex Notation=TeX>
international conference on electron devices and solid-state circuits | 2009
Wensuo Chen; Gang Xie; Bo Zhang; Z.J. Li; Mei Zhao
muhbox{s}
Electronics Letters | 2007
Ming Qiao; B. Zhang; Z.J. Li; J. Fang
</tex></formula> with the load current switching from 100 <formula formulatype=inline><tex Notation=TeX>
Electronics Letters | 2008
Xiangang Luo; Baoshun Zhang; Z.J. Li; Wentong Zhang; Z. Zhan; H. Xu
muhbox{A}
Electronics Letters | 2006
Wensuo Chen; B. Zhang; Z.J. Li
</tex></formula> to 100 mA at a 1.2-<formula formulatype=inline> <tex Notation=TeX>
Electronics Letters | 2012
Lijuan Wu; Wentong Zhang; Ming Qiao; B. Zhang; Z.J. Li
muhbox{A}
Electronics Letters | 2007
J. Zhang; Baoshun Zhang; Z.J. Li
</tex></formula> quiescent current.
Electronics Letters | 2009
W.L. Wang; Baoshun Zhang; Wensuo Chen; Z.J. Li
An enhanced double current limit technique suitable for high power buck converter is presented in this paper to protect the converter from damage under any fault condition. The first peak current limit circuit works properly when the output is in minor over load. If the current increases continuously to some amount after the first peak current limit working in major overload or short circuit, the frequency of the BUCK converter is decreased by the second peak current limit circuit. The duty cycle can decrease below the value normally limited by the propagation delay in this way. The enhanced current limit technique has been validated with UMC 0.6-µm BCD process based on a monolithic voltage-mode BUCK converter capable of driving up to 3A loads with supply voltage from 8 to 30V. Simulation results demonstrate that the proposed current limit technique can guarantee the BUCK converter operating properly under any condition without damage.1