A.Y. Borisov

Automated test complex for operational amplifier ICS parametric and functioning monitoring

The article discusses automated test complex based on the PXI devices basis for monitoring parameters and functioning of integrated opamp during radiation experiments. Need of measurements and input signals high accuracy support is specified.

Automated test system for parametric control of voltage supervisors

This article describes the automated test facility system for parametric control of voltage supervisors before, during and after irradiation in radiation tests based on the National instruments PXI family equipment.

Automatic test complex for parametric control of power NMOS and PMOS transistors

This article describes the automated test complex for parametric control of power n- and p-MOSFET transistors before, during and after irradiation tests based on the National instruments PXI standard equipment.

Automated test complex for parametric and functional control of voltage regulators and DC-DC converters

This article describes the process of creating an automated test complex for simultaneous parameters control of several voltage regulators and DC/DC-converters under irradiation based on the National Instruments PXI family equipment.

Electric regime influence on the DC-DC converters’s hardness to single event transients

The influence of the electric operating regime of hybrid pulse DC-DC converters on the number of single event transient and, consequently, the sensetive parameters is analyzed. The predicted dependence of the single-effect characteristic in hybrid stabilizers on the electric regime in general and the feedback performance in particular is confirmed experimentally. The recommendations for carrying out the certification tests for the sensetive of hybrid voltage stabilizers to single effects are outlined.

Automated test complex for parametric and functional control of voltage-to-frequency converter

This paper describes a custom developed automated test complex for linear voltage-to-frequency converter based on PXI-standard equipment managed by LabView software. The main parts of block diagram are described in detail. The complex was successfully applied in test experiments.

Electrical Mode Influence on TID Sensitivity of Integrated and Hybrid DC-DC Converters

Total dose experimental results for different types of voltage regulators is presented and analyzed. The worst irradiation cases are revealed.

DC–DC's total ionizing dose hardness decrease in passive reserve mode

Abstract The usual and effective way to increase on-board electronics reliability and general radiation hardness is the usage of “sleeping” (shutdown) mode and “passive” reserve of vulnerable blocks and elements. This work presents the comparative radiation test results of hybrid and integrated DC–DC converters TIDs sensitivity in active, sleeping and passive modes. The obtained experimental data demonstrates that TID hardness of bipolar, BiCMOS and hybrid DC–DCs in the unbiased condition is at least not higher than their normally biased mode. Moreover some of bipolar integrated DC–DCs have relatively higher radiation-induced degradation while unbiased, so their “passive” (so-called “cold”) reserve mode may be the worst case mode for TIDs hardness level.

Different Chips at Identical Marking on the Example of OP1177

Four parts of opamp OP1177ARZ manufactured by Analog Devices have been tested. The chips have been compared visually and with specialized software. Forms of ionization response in three checkpoints have been registered, and maps of response amplitudes on the crystal surface have been constructed. It has been determined , that crystals samples are various in spite of identical crystals marking. So TID behavior of various samples has been observed.