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Dive into the research topics where Akihiko Ariga is active.

Publication


Featured researches published by Akihiko Ariga.


Archive | 2007

Method of manufacturing semiconductor apparatus

Ryuji Kono; Makoto Kitano; Hideo Miura; Hiroyuki Ota; Yoshishige Endo; Takeshi Harada; Masatoshi Kanamaru; Teruhisa Akashi; Atsushi Hosogane; Akihiko Ariga; Naoto Ban


Archive | 1999

Process for manufacturing semiconductor device

Ryuji Kono; Makoto Kitano; Hideo Miura; Hiroyuki Ota; Yoshishige Endo; Takeshi Harada; Masatoshi Kanamaru; Teruhisa Akashi; Atsushi Hosogane; Akihiko Ariga; Naoto Ban


Archive | 1998

Connector and probing system

Susumu Kasukabe; Terutaka Mori; Akihiko Ariga; Hidetaka Shigi; Takayoshi Watanabe; Ryuji Kono


Archive | 2003

Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step

Ryuji Kohno; Tetsuo Kumazawa; Makoto Kitano; Akihiko Ariga; Yuji Wada; Naoto Ban; Shuji Shibuya; Yasuhiro Motoyama; Kunio Matsumoto; Susumu Kasukabe; Terutaka Mori; Hidetaka Shigi; Takayoshi Watanabe


Archive | 1998

CONNECTING APPARATUS, MANUFACTURE OF WIRING FILM WITH BIASING MEMBER AND MANUFACTURE OF INSPECTION SYSTEM AND SEMICONDUCTOR ELEMENT

Akihiko Ariga; Naoto Ban; Yasushi Inoue; Susumu Kasukabe; Terutaka Mori; Masakazu Sugimoto; Takayoshi Watabe; 泰史 井上; 直人 伴; 進 春日部; 昭彦 有賀; 正和 杉本; 照享 森; 隆好 渡部


Archive | 2002

Method for manufacturing semiconductor device utilizing semiconductor testing equipment

Masatoshi Kanamaru; Yoshishige Endo; Atsushi Hosogane; Tatsuya Nagata; Ryuji Kohno; Hideyuki Aoki; Akihiko Ariga


Archive | 2000

Semiconductor testing equipment with probe formed on a cantilever of a substrate

Masatoshi Kanamaru; Yoshishige Endo; Atsushi Hosogane; Tatsuya Nagata; Ryuji Kohno; Hideyuki Aoki; Akihiko Ariga


Archive | 1997

Manufacture of semiconductor element and method for probing to semiconductor element

Akihiko Ariga; Susumu Kasukabe; Ryuji Kono; Terutaka Mori; Hidetaka Shigi; Takayoshi Watabe; 英孝 志儀; 進 春日部; 昭彦 有賀; 照享 森; 竜治 河野; 隆好 渡部


Archive | 2004

Connection device and test system

Susumu Kasukabe; Terutaka Mori; Akihiko Ariga; Hidetaka Shigi; Takayoshi Watanabe; Ryuji Kono


Archive | 1998

Connector and inspection system

Akihiko Ariga; Susumu Kasukabe; Ryuji Kono; Terutaka Mori; Hidetaka Shigi; Takayoshi Watabe; 英孝 志儀; 進 春日部; 昭彦 有賀; 照享 森; 竜治 河野; 隆好 渡部

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