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Dive into the research topics where Naoto Ban is active.

Publication


Featured researches published by Naoto Ban.


Archive | 2007

Method of manufacturing semiconductor apparatus

Ryuji Kono; Makoto Kitano; Hideo Miura; Hiroyuki Ota; Yoshishige Endo; Takeshi Harada; Masatoshi Kanamaru; Teruhisa Akashi; Atsushi Hosogane; Akihiko Ariga; Naoto Ban


Archive | 2001

Fabrication method of semiconductor integrated circuit device and its testing apparatus

Naoto Ban; Masaaki Namba; Akio Hasebe; Yuji Wada; Ryuji Kohno; Akira Seito; Yasuhiro Motoyama


Archive | 2003

Semiconductor inspection apparatus

Ryuji Kohno; Hideo Miura; Yoshishige Endo; Masatoshi Kanamaru; Atsushi Hosogane; Hideyuki Aoki; Naoto Ban


Archive | 1999

Process for manufacturing semiconductor device

Ryuji Kono; Makoto Kitano; Hideo Miura; Hiroyuki Ota; Yoshishige Endo; Takeshi Harada; Masatoshi Kanamaru; Teruhisa Akashi; Atsushi Hosogane; Akihiko Ariga; Naoto Ban


Archive | 2003

Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step

Ryuji Kohno; Tetsuo Kumazawa; Makoto Kitano; Akihiko Ariga; Yuji Wada; Naoto Ban; Shuji Shibuya; Yasuhiro Motoyama; Kunio Matsumoto; Susumu Kasukabe; Terutaka Mori; Hidetaka Shigi; Takayoshi Watanabe


Archive | 2002

Manufacture method for semiconductor inspection apparatus

Ryuji Kohno; Hideo Miura; Yoshishige Endo; Masatoshi Kanamaru; Atsushi Hosogane; Hideyuki Aoki; Naoto Ban


Archive | 1998

CONNECTING APPARATUS, MANUFACTURE OF WIRING FILM WITH BIASING MEMBER AND MANUFACTURE OF INSPECTION SYSTEM AND SEMICONDUCTOR ELEMENT

Akihiko Ariga; Naoto Ban; Yasushi Inoue; Susumu Kasukabe; Terutaka Mori; Masakazu Sugimoto; Takayoshi Watabe; 泰史 井上; 直人 伴; 進 春日部; 昭彦 有賀; 正和 杉本; 照享 森; 隆好 渡部


Archive | 2002

Semiconductor device testing apparatus and method for manufacturing the same

Masatoshi Kanamaru; Yoshishige Endo; Takanori Aono; Ryuji Kohno; Hiroya Shimizu; Naoto Ban; Hideyuki Aoki


Archive | 1998

Method for manufacturing substrate for inspecting semiconductor device

Masatoshi Kanamaru; Atsushi Hosogane; Yoshishige Endou; Ryuji Kouno; Hideo Miura; Shinji Tanaka; Hiroyuki Ohta; Akihiko Ariga; Naoto Ban; Hideyuki Aoki


Archive | 2002

MANUFACTURING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR INSPECTION DEVICE

Naoto Ban; Akio Hasebe; Ryuji Kono; Yasuhiro Motoyama; Irizou Nanba; 直人 伴; 康博 本山; 竜治 河野; 昭男 長谷部; 入三 難波

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