Alexandre Douin

Influence of Laser Pulse Duration in Single Event Upset Testing

Device simulations of laser induced SEU in an SRAM cell are performed with pulse durations from 100 fs to 100 mus. SEU threshold energy is notably dependent on the pulse duration. Two regimes are identified and modeled analytically and electrically

Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results

The reconfigurability of SRAM-based FPGAs has also some drawbacks, especially when used in systems requiring a high level of safety and/or dependability. Dealing with single-event effects is an important issue in these systems. This paper presents a software tool to analyze a bit-stream and the functional effects of errors in it. Results of analyzes are presented, based on experiments using a laser platform to inject faults in the circuit.

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.

Electrical modeling for laser testing with different pulse durations

This paper presents a simple electrical model of laser-induced currents in a single MOS transistor for different laser pulse durations. This model is validated by mixed-mode device simulations of a laser-induced fault in an SRAM cell for different laser pulse durations ranging from 100fs to 10ns. This model can be used for netlist level simulation of pulsed laser online testing in the context of radiation hardening, semi-invasive attacks, or more generally, hardware level fault injection techniques.

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Abstract This paper presents an improvement of the time resolution of the Photoelectric Laser Stimulation technique using the phase of a mode-locked laser as a reference to generate an electrical stimulus for the device under test. This synchronization system was applied to observe signal propagation in an 860 MHz ring oscillator.

Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation

This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.

Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits

This paper deals with the characterization of the timing resolution of the time-resolved photoelectric laser stimulation (TRLS) technique using ultra short pulses. A new synchronization system is presented and the timing resolution is measured. The TRLS technique is applied to visualize the signal propagation in an 860MHz ring oscillator.

In-depth resolution for LBIC technique by two-photon absorption

A detailed study of the in-depth dependence of the laser-beam-induced current (LBIC) technique by sub-bandgap two-photon absorption (TPA) has been carried out in this paper. The strong focal dependence mechanism for TPA has been demonstrated by our studies through comparing the TPA technique with traditional single-photon-absorption-based ones. Dependence of the TPA-induced single-event transient response in linear integrated circuits on depth and position is investigated. Our results illustrate an interesting in-depth resolution for the TPA technique, which enables three-dimensional imaging of charge-collecting volumes through the backside of integrated circuits.

Identification of some key parameters for photoelectric laser stimulation of IC: an experimental approach

The aim of this paper is to give a phenomenological approach of PLS in order to establish and justify what is the right choice of key parameters to perform a specific analysis. In this paper, we mostly focus on medium and low laser power density range. Our approach is built from experimental studies done on different apparatus giving us a wide range of parameter choices: from power densities in GW/cm/sup 2/ to mW/cm/sup 2/ range, from continuous to ultra short pulse, from fixed position to variable slow scan. This unique opportunity, experimental results and simulation performed has contributed to extend PLS knowledge.