Amy K. Moran

Commercial microelectronics technologies for applications in the satellite radiation environment

As spacecraft require reduced parameters such as power, weight, volume, and cost, while increasing performance requirements, enabling technologies have come to the forefront. We present data and design strategies for these enabling technologies in spacecraft.

Current single event effect test results for candidate spacecraft electronics

We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters.

Single event effect proton and heavy ion test results for candidate spacecraft electronics

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.

Radiation effect characterization and test methods of single-chip and multi-chip stacked 16 Mbit DRAMs

This paper presents radiation effects characterization performed by the NASA Goddard Space Flight Center (GSFC) on spaceflight candidate 16 Mbit DRAMs. This includes heavy ion, proton, and Co/sup 60/ irradiations on single-chip devices as well as proton irradiation of a stacked DRAM module. Lastly, a discussion of test methodology is undertaken.

Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

Single event effect test results for candidate spacecraft electronics

We present both heavy ion and proton single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital, analog, and fiber optic devices were tested, including DRAMs, FPGAs and fiber links.

Single event effect proton and heavy ion test results in support of candidate NASA programs

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. The variety of analog and digital devices tested includes ADCs, DC-DC converters, DRAMs, linear devices, and microprocessors.

In-flight analysis of enabling technology

Flight and ground test Single Event Effect (SEE) data are presented on spacecraft systems and experiments utilizing three enabling technologies, a Fiber Optic Data Bus (FODB), a Solid State Recorder (SSR), and a power metal oxide semiconductor field effect transistor (MOSFET). Extended datasets on system and device performance from multiple NASA spacecraft and experiments, as well as design implications of flight results, are discussed.