M.M. Gates

Single-event-effect mitigation from a system perspective

With the sharp decline in the availability of radiation-hardened devices from manufacturers, as well as the desire to shrink power, weight, and volume of spacecraft systems, the use of devices that are susceptible to single-event effects (SEEs) has become commonplace. We present herein a perspective and users tool for understanding SEEs and potential system-level mitigation techniques.

SEDS MIL-STD-1773 fiber optic data bus: Proton irradiation test results and spaceflight SEU data

Proton test and space-flight single event effect data for NASAs first fiber optic data bus are presented. Bit error rate predictions based on a proton direct ionization model agree well with flight data for proton-belt and solar-flare effects. Specifically, the authors discuss the SEUs (single event upsets) seen in space during the first months of the SAMPEX (Solar Anomalous Magnetospheric Particle Explorer) mission, including a solar flare from October 30 through November 6, 1992, their impact, and comparison to predicted SEU rates. The fact that the interpretation of test results leads to a flight model which assumes direct ionization effects suggests that the occurrence of retransmissions could be significantly reduced with design changes to the receiver. A comparison of the measured and predicted rates for the present implementation with those expected for a III-IV based detector showed that improvement would follow from both a smaller physical cross-section, and greatly reduced particle pathlengths through a thinner direct band-gap detector. >

Commercial microelectronics technologies for applications in the satellite radiation environment

As spacecraft require reduced parameters such as power, weight, volume, and cost, while increasing performance requirements, enabling technologies have come to the forefront. We present data and design strategies for these enabling technologies in spacecraft.

Single event effect proton and heavy ion test results for candidate spacecraft electronics

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.

Solid State Tape Recorders: Spaceflight SEU Data For SAMPEX And TOMS/meteor-3

Spaceflight single event upset (SEW data for the solid state tape recorders (SSTRs) for the SAMPEX and ToMSFIeteor-3 missions are presented. Both SSTRs utilize H i t a ~ 256 kbit SRAMs.

Radiation effect characterization and test methods of single-chip and multi-chip stacked 16 Mbit DRAMs

This paper presents radiation effects characterization performed by the NASA Goddard Space Flight Center (GSFC) on spaceflight candidate 16 Mbit DRAMs. This includes heavy ion, proton, and Co/sup 60/ irradiations on single-chip devices as well as proton irradiation of a stacked DRAM module. Lastly, a discussion of test methodology is undertaken.

Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

We present the spaceflight Single Event Effect (SEE) data for the emerging commercial technologies utilized in multiple NASA spacecraft and experiments. Analyses of device performance as well as design implications of the flight results are discussed.

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

Single event effect ground test results for a fiber optic data interconnect and associated electronics

As spacecraft unlock the potential of fiber optics for spaceflight applications, system level bit error rates become of concern to the system designer. We present ground test data and analysis on candidate system components. >