Donald K. Hawkins

Current single event effects and radiation damage results for candidate spacecraft electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital, linear, and hybrid devices.

Recent radiation damage and single event effect results for candidate spacecraft electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.

Recent radiation damage and single event effect results for microelectronics

We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.

Compendium of Current Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices

Current single event effect test results for candidate spacecraft electronics

We present both proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. A variety of digital and analog devices were tested, including EEPROMs, DRAMs, and DC-DC converters.

Single event effect proton and heavy ion test results for candidate spacecraft electronics

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. Device types include digital and analog components, MIL-STD-1553B transceivers, ADCs, FPGAs, SRAMs, optoelectronics, and a microprocessor.

Current single event effects results for candidate spacecraft electronics for NASA

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.

Single event effect ground test results for a fiber optic data interconnect and associated electronics

As spacecraft unlock the potential of fiber optics for spaceflight applications, system level bit error rates become of concern to the system designer. We present ground test data and analysis on candidate system components. >

Single event effect proton and heavy ion test results in support of candidate NASA programs

We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. The variety of analog and digital devices tested includes ADCs, DC-DC converters, DRAMs, linear devices, and microprocessors.