Anjali Kinra

Diagnostic techniques for the UltraSPARC/sup TM/ microprocessors

Successful manufacturing ramp of a complex high speed microprocessor requires quick and reliable test and diagnostic methods. Some commonly used debug techniques for the UltraSPARC family of devices are presented with actual result of some diagnosed failures.

Searching for Common Ground Between Low Cost and High Performance ATE Systems

A major challenge in the test domain is finding an ATE (Automatic Test Equipment) platform that meets both production requirements and engineering debug needs. Too often, the compromise is to support multiple test platforms for a single design. Another complication in the selection criteria can be the lack of or inadequacy of desired features on a particular tester. Furthermore, variations between product groups and companies can exacerbate the process of determining what qualifies as a mainstream ATE requirement. While this abstraction can be a daunting task, it is a necessary metric for ATE companies.