Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Arthur D. Tuminaro.
IEEE Design & Test of Computers | 2010
Rajiv V. Joshi; Anthony R. Pelella; Arthur D. Tuminaro; Yuen Chan; Rouwaida Kanj
Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks.
Archive | 1990
Arthur D. Tuminaro; Yuen H. Chan; Philip T. Wu
Archive | 2005
Yuen H. Chan; Ryan T. Freese; Antonio R. Pelella; Arthur D. Tuminaro
european solid-state circuits conference | 2005
Antonio R. Pelella; Arthur D. Tuminaro; Ryan T. Freese; Yuen H. Chan
Archive | 2005
Yuen H. Chan; Ryan T. Freese; Antonio R. Pelella; Arthur D. Tuminaro
Archive | 2007
Yuen H. Chan; Ryan T. Freese; Antonio R. Pelella; Uma Srinivasan; Arthur D. Tuminaro; Jatinder K. Wadhwa
Archive | 2003
Rajiv V. Joshi; Arthur D. Tuminaro
Archive | 1991
William R. Dachtera; Leonard Carl Ritchie; Arthur D. Tuminaro
Archive | 2007
Yuen H. Chan; Ryan T. Freese; Antonio R. Pelella; Arthur D. Tuminaro
Archive | 2004
Yuen H. Chan; Timothy J. Charest; John R. Rawlins; Arthur D. Tuminaro; Jatinder K. Wadhwa; Otto M. Wagner
