Ayman M. Wahba
Joseph Fourier University
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Featured researches published by Ayman M. Wahba.
CHARME '95 Proceedings of the IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods | 1995
Ayman M. Wahba; Dominique Borrione
We present a new diagnostic algorithm for localising design errors in sequential circuits. The specification and the implementation may have different number of state variables, and different state encoding. The algorithm is based on the new concept of possible next states describing the possible states of the circuit due to the existence of the error. Results obtained on benchmark circuits show that the error is always found, with an execution time proportional to the product of the circuit size, and the length of the test sequences used.
Journal of Electronic Testing | 1996
Ayman M. Wahba; Dominique Borrione
We present a new diagnostic algorithm, based on backward-propagation, for localising design errors in combinational logic circuits. Three hypotheses are considered, that cover all single gate replacement and insertion errors. Diagnosis-oriented test patterns are generated in order to rapidly reduce the suspected area where the error lies. The originality of our method is the use of patterns which do not detect the error, in addition to detecting patterns. A theorem shows that, in favourable cases, only two patterns suffice to get a correction. We have implemented the test generation and diagnosis algorithms. Results obtained on benchmarks show that the error is always found, after the application of a small number of test patterns, with an execution time proportional to the circuit size.
european design and test conference | 1997
Ayman M. Wahba; Dominique Borrione
We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the Prevail/sup TM/ system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns.
formal methods in computer aided design | 1996
Dominique Borrione; H. Bouamama; David Déharbe; C. Le Faou; Ayman M. Wahba
We present an open environment for the integration of formal methods applied to HDL descriptions of circuits. The system currently accepts SMAX[4] and VHDL, and provides equivalence checking, model checking, theorem proving, and automatic diagnosis of simple design errors. After an overview of the system, we discuss the salient features of the common intermediate format, of the diagnosis tools, and of the automatic generation of NQTHM[11] models from VHDL functional descriptions.
CHARME '93 Proceedings of the IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods | 1993
Ayman M. Wahba; Einar Johan Aas
Ternary vectors {0,1,X} may be used to simulate binary systems more efficiently than binary vectors. It has recently been shown by R.E. Bryant that formal verification by ternary simulation is feasible. In this paper, we demonstrate that complete verification of Finite State Machines is possible by ternary simulation. The verification vectors are derived from AND/OR trees. We also show how design error diagnosis can be performed by utilizing the difference vector set. Algorithms for the diagnosis of single inverter errors, and wrong gate type, are presented, together with illustrative examples.
european design automation conference | 1996
Ayman M. Wahba; Dominique Borrione
An automated tool for diagnosing simple design errors in VHDL description is presented. The tool is tested on benchmark circuits, and the results show that the error is localized precisely, after the application of a small number of specially generated test patterns. This tool is now integrated within the PREVAIL/sup TM/ system, and is being tested on industrial circuits.
International Journal of Software Engineering and Knowledge Engineering | 2009
Samer I. Mohamed; Islam A. M. El-Maddah; Ayman M. Wahba
Software maintenance becomes an integral part of software life cycle and constitutes the most important fraction of the total cost of the software lifecycle. Around 50–80 percent of the total lifec...
Software Engineering Research and Practice | 2008
Samer I. Mohamed; Islam A. M. El-Maddah; Ayman M. Wahba
IADIS AC (1) | 2009
Anaheed Ayoub; Ayman M. Wahba; Ashraf Salem; Mohamed Taher; Mohamed A. Sheirah
forum on specification and design languages | 2003
Anaheed Ayoub; Ayman M. Wahba; Ashraf Salem; Mohamed A. Sheirah