Benoit Mongellaz

Improvement of aging simulation of electronic circuits using behavioral modeling

This paper presents an original method of analog circuits aging simulation. This method is based on a behavioral modelling of circuits that includes the effects of degradations on circuit parameters, on the basis of transistors aging. The efficiency of the method is demonstrated in the case of hot carriers degradation in an amplifier

Improvement of ageing simulation of electronic circuits based on behavioural modelling

In this paper, we will demonstrate how to improve the ageing simulation by the use of a behavioural modelling language like VHDL-AMS, in order to efficiently simulate the reliability of integrated circuit in their electrical context.

CMOS transistor electrical ageing experiments to build VHDL-AMS behavioral models

This paper presents an experimental case study of CMOS technology ageing. Our approach is based on a methodology that implies experimental tests to evaluate electrical ageing effects on MOSFET. The experimental data set is used to build a MOSFET device ageing VHDL-AMS model. Then, this ageing model is used to build an OTA ageing VHDL-AMS model. This two electrical ageing models are respectively used in simulation to evaluate ageing effects on electrical performances.

Reliability simulation of electronic circuits with VHDL-AMS

Because of the evolution of the reliability of electronic circuits toward very low failure rate, the statistical analyses through accelerated ageing experiments become too expensive. Today, a deterministic approach of the physics of failure is necessary to estimate the life duration of the circuits. As the ageing mechanisms are highly dependent on the circuit operating conditions, electrical simulation is a very useful tool to help the assessment of the degradation effect. This paper will present on the basis of a practical case the advantages to use a behavioural modelling language like VHDL-AMS for the simulation of ageing of electronic circuits and an original approach for the simulation of the ageing of complex systems.