Bernard Majoux
STMicroelectronics
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Publication
Featured researches published by Bernard Majoux.
Analog Integrated Circuits and Signal Processing | 2002
Wenceslas Rahajandraibe; Christian Dufaza; Daniel Auvergne; Bruno Cialdella; Bernard Majoux; Vivek Chowdhury
The temperature dependence of the IC(VBE) relationship can be characterised by two parameters: EG and XTI. They are usually obtained from measured VBE(T) values, using least square algorithm at a constant collector current. This method involves an accurate measurement of VBE and of the operating temperature. A new configurable test structure dedicated to their extraction is presented in this paper. It allows a direct measurement of the die temperature and consequently an accurate measurement of VBE(T). This new technique is implemented on a ST-Microelectronics BiCMOS process. Resulting experimental data are analysed and discussed. An improvement of the bandgap reference design is presented.
Archive | 1995
Philippe Sirito-Olivier; Bernard Majoux
Archive | 1994
Colette Laot; Bernard Majoux
Archive | 1993
Jean-Claude Kaire; Bernard Majoux; Serge Pontarollo
Archive | 1999
Philippe Sirito-Olivier; Bernard Majoux
Archive | 1993
Colette Laot; Bernard Majoux
conference on design of circuits and integrated systems | 2008
Wenceslas Rahajandraibe; Daniel Auvergne; Christian Dufaza; Bruno Cialdella; Bernard Majoux; Vivek Chowdhury
ESSCIRC'02: 28th European Solid-State Circuit Conference | 2008
Wenceslas Rahajandraibe; Daniel Auvergne; Christian Dufaza; Bruno Cialdella; Bernard Majoux; Vivek Chowdhury
design, automation, and test in europe | 2002
Wenceslas Rahajandraibe; Christian Dufaza; Daniel Auvergne; Bruno Cialdella; Bernard Majoux; Vivek Chowdhury
Archive | 1995
Philippe Sirito-Olivier; Bernard Majoux
