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Dive into the research topics where Berthold Reimer is active.

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Featured researches published by Berthold Reimer.


Solid State Phenomena | 2014

Selective Nitride Etching with Phosphoric and Sulfuric Acid Mixtures Using a Single-Wafer Wet Processor

Vincent Sih; Berthold Reimer; Jeffrey M. Lauerhaas; Jeffery W. Butterbaugh

Selective nitride etching in semiconductor manufacturing is currently performed in wet benches using hot orthophosphoric acid at 160-180C. This process requires silica seasoning to achieve the desired selectivity to silicon oxide. Silica seasoning in wet benches is achieved by etching blanket silicon nitride wafers prior to running productions runs. While, this method of selective silicon nitride etching has been successful in the past, particle requirements at advanced nodes [1] are driving the need for a new solution. Single wafer wet processing is proposed as a way to meet these challenging new particle specifications.


Archive | 2010

Uniform high-k metal gate stacks by adjusting threshold voltage for sophisticated transistors by diffusing a metal species prior to gate patterning

Richard Carter; Falk Graetsch; Martin Trentzsch; Sven Beyer; Berthold Reimer; Robert Binder; Boris Bayha


Archive | 2012

TECHNIQUE FOR EXPOSING A PLACEHOLDER MATERIAL IN A REPLACEMENT GATE APPROACH BY MODIFYING A REMOVAL RATE OF STRESSED DIELECTRIC OVERLAYERS

Klaus Hempel; Patrick Press; Vivien Schroeder; Berthold Reimer; Johannes Groschopf


Archive | 2014

METHODS OF FORMING A SEMICONDUCTOR DEVICE BY PERFORMING A WET ACID ETCHING PROCESS WHILE PREVENTING OR REDUCING LOSS OF ACTIVE AREA AND/OR ISOLATION REGIONS

Berthold Reimer; Markus Lenski; Bastian Haussdoerfer; Ardechir Pakfar


Archive | 2010

MAINTAINING INTEGRITY OF A HIGH-K GATE STACK BY PASSIVATION USING AN OXYGEN PLASMA

Sven Beyer; Rick Carter; Andreas Hellmich; Berthold Reimer


Archive | 2011

Superior integrity of a high-K gate stack by forming a controlled undercut on the basis of a wet chemistry

Sven Beyer; Berthold Reimer; Falk Graetsch


Archive | 2011

Methods of Controlling the Etching of Silicon Nitride Relative to Silicon Dioxide

Berthold Reimer; Claudia Wolf


Archive | 2010

Enhanced etch stop capability during patterning of silicon nitride including layer stacks by providing a chemically formed oxide layer during semiconductor processing

Sven Beyer; Berthold Reimer; Falk Graetsch


Archive | 2013

Methods for etching dielectric materials in the fabrication of integrated circuits

Johannes von Kluge; Berthold Reimer


Archive | 2012

METHODS FOR PFET FABRICATION USING APM SOLUTIONS

Joanna Wasyluk; Stephan Kronholz; Berthold Reimer; Sven Metzger; Gregory Nowling; John Foster; Paul R. Besser

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