Dale E. Graessle

The Chandra X-ray Observatory calibration database (CalDB): building, planning, and improving

The calibration database implemented for the Chandra X-ray Observatory is the most detailed and extensive CalDB of its kind to date. Built according to the NASA High Energy Astrophysics Science Archive Research Center (HEASARC) CalDB prescription, the Chandra CalDB provides indexed, selectable calibration data for detector responses, mirror effective areas, grating efficiencies, instrument geometries, default source aim points, CCD characteristics, and quantum efficiencies, among many others. The combined index comprises approximately 500 entries. A standard FTOOLS parametric interface allows users and tools to access the index. Unique dataset selection requires certain input calibration parameters such as mission, instrument, detector, UTC date and time, and certain ranged parameter values. The goals of the HEASARC CalDB design are (1) to separate software upgrades from calibration upgrades, (2) to allow multi-mission use of analysis software (for missions with a compliant CalDB) and (3) to facilitate the use of multiple software packages for the same data. While we have been able to meet the multivariate needs of Chandra with the current CalDB implementation from HEASARC, certain requirements and desirable enhancements have been identified that raise the prospect of a developmental rewrite of the CalDB system. The explicit goal is to meet Chandras specific needs better, but such upgrades may also provide significant advantages to CalDB planning for future missions. In particular we believe we will introduce important features aiding in the development of mission-independent analysis software. We report our current plans and progress.

Iridium optical constants for the Chandra X-ray Observatory from reflectance measurements of 0.05-12 keV

We present optical constants derived from synchrotron reflectance measurements of iridium-coated X-ray witness mirrors over 0.05-12 keV, relevant to the Chandra X-ray Observatory effective area calibration. In particular we present for the first time analysis of measurements taken at the Advanced Light Source Beamline 6.3.2 over 50-1000 eV, Chandras lower-energy range. Refinements to the currently tabulated iridium optical constants (B. L. Henke et al., At. Data Nucl. Data Tables 54, 181-343, 1993 and on the Web at http://www-cxro.lbl.gov/optical_constants/) will become important as the low-energy calibration of Chandras X-ray detectors and gratings are further improved, and as possible contaminants on the Chandra mirror assembly are considered in the refinement of the in-flight Ir absorption edge depths. The goal of this work has been to provide an improved tabulation of the Ir optical constants over the full range of Chandra using a self-consistent mirror model, including metallic layers, interface roughness, contaminating overlayer, and substrate. The low-energy data present us with a considerable challenge in the modeling of the overlayer composition, as the K-absorption features of C, O, and N are likely to be present in the ~10A overlayer. The haphazard contamination and chemical shifts may significantly affect optical constants attributed to this overlayer, which will distort the iridium optical constants derived. Furthermore, the witness mirror contamination may be considerably different from that deposited on the flight optics. The more complex modeling required to deal with low-energy effects must reduce to the simpler model applied at the higher energies, which has successfully derived optical constants for iridium in the higher energy range, including the iridium M-edges, already used in the Chandra calibration. We present our current results, and the state of our modeling and analysis, and our approach to a self-consistent tabulation.

Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation

We are developing a system to calibrate reflectances of witness coupons to the AXAF flight mirrors at the National Synchrotron Light Source over the 0.05-12 keV energy range. These witness coupons will be coated in the same process as the AXAF mirror elements. One of the key issues is the accurate determination of mirror efficiencies across the absorption edges of the mirror coating elements. We present a series of reflectance measurements with 2 eV resolution of a nickel-coated flat mirror in the region of the Ni L-II (870 eV) and L-III (853 eV) absorption edges. Scans of reflectance versus grazing angle at fixed energies in this region show distinct interference fringes at grazing angles larger than the critical angle which are extinguished as the photon energy is increased beyond the low point of the L-III edge, indicating total absorption of the evanescent wave within the Ni film. At 51 arc minutes grazing angle, measured reflectance decreases smoothly by 35 percent and then recovers in an 8 eV band at the L-III edge. We have also measured reflectances in the M absorption edge region for gold, platinum, and iridium coated mirrors. We derive optical parameters n and k specific to the film for comparison to the existing data tables.

Modeling the diffraction efficiencies of the AXAF high-energy transmission gratings: II

In order to characterize the instrumentation on AXAF, each of the science instrument teams carries out sub-assembly calibrations. For the high energy transmission grating (HETG) group, this means individual measurements of the diffraction efficiencies of each of the 336 grating elements that goes into the completed HETG assembly. Measurements are made at a number of energies (corresponding to x-ray emission lines) which fix the parameters of a model. This model is determined from first principles and verified by extensively testing sample grating elements at synchrotron radiation facilities. Here we present new synchrotron radiation (SR) data obtained at the national Synchrotron Light Source (NSLS) and at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt (PTB) using the electron storage ring BESSY in Berlin. The gratings are from AXAF flight lots, and we apply an improved data reduction technique which builds on our experience from last year (Markert et al., SPIE Proceedings 2518, 424, 1995). Our analysis takes into account the effects of small extended wings in the diffraction of the various orders in the NSLS data. Our goal is to obtain efficiencies in the 0th and plus/minus 1st diffraction orders which are accurate in the 1% level, except near absorption edges, where accuracies in the 5% to 10% level are required. With a few exceptions (discussed here) our new data/improved model meets these goals.

AXAF-mirror effective area calibration using the C-continuum source and solid state detectors

The AXAF X-ray mirrors underwent thorough calibration using the X-ray Calibration Facility (XRCF) at the Marshall Space Flight Center in Huntsville, AL from late 1996 to early 1997. The x-ray calibration made novel use of the x-ray continuum from a conventional electron-impact source. Taking advantage of the good spectral resolution of solid-state detectors, continuum measurements proved advantageous in calibration the effective area of AXAFs High-Resolution Mirror Assembly (HRMA) for the entire AXAF energy band. The measurements were made by comparing the spectrum detected by a SSD at the focal plane with the spectrum detected by a beam normalization SSD. The HRMA effective area was calibrated by comparing the measurements with the HRMA raytrace model. The HRMA on-orbit performance predictions are made using the calibration results.

Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV

We report iridium optical constants fitted from synchrotron reflectance data. Specifically, we have used the NKFIT algorithm of D. L. Windt to derive (delta) (E) and (beta) (E) from 2 - 12 keV reflectance calibrations of AXAF witness mirrors. The model is applied at each energy separately, to fit four to nine data points from reflectance-versus-energy scans at selected grazing angles. The stability of the model in the presence of Gaussian noise has been tested extensively. We report the results of several bias studies, involving the generation and analysis of artificial data. Bias studies have been used to determine the optimal grazing angles to be scanned in the various x-ray energy ranges to condition the optical constants. They have also been used to investigate the effects of individual errant data points on the resulting fits and derived optical constants. The results will aid in eliminating systematic errors in the derived optical constants. We also present results of our investigation of the Debye-Waller and Nevot-Croce roughness correction algorithms as applied to our measurements. The Nevot-Croce method gives a much better representation of the data, however its rigorous justification in this experiment is lacking, and the roughness parameter derived is not constant with energy. A more self- consistent model for roughness correction is sought.

Molecular contamination study of iridium-coated x-ray mirrors

We have completed extensive synchrotron reflectivity measurements on several iridium mirrors which were intentionally coated with thin layers (100 angstroms or less) of polyethylene, a hydrocarbon contaminant. The purpose was to verify theoretical predictions of alterations in reflection efficiency of an iridium surface for various thicknesses of hydrocarbon contamination, and to evaluate the acceptability of attainable upper limits of such contamination for the mirrors aboard NASAs Advanced X-ray Astrophysics Facility (AXAF). Although the deposition of such thin layers is problematic with no systematic guarantee of uniform thickness or density, successful analysis by modeling the contaminant as a uniform surface layer may be done, within a limited X-ray energy range. The M-edges of iridium are significantly affected by the polyethylene layers. For the most part, contamination increases the reflectance in the M-edge range over that of bare iridium, although cross-over points between contaminated and uncontaminated mirrors occur at several angles relevant to AXAF. However, calibratability of the reflectance is a more significant issue than X-ray mirror efficiency. We present the modeling results for three thicknesses of polyethylene, and discuss the implications for the performance of AXAF mirrors and their calibratability.

ACIS UV/optical blocking filter calibration at the National Synchrotron Light Source

Measurements of the transmission properties of the AXAF CCD imaging spectrometer (ACIS) UV/optical blocking filters were performed at the National Synchrotron Light Source at Brookhaven Laboratories. The X-ray transmissions of two Al:Si/LEXAN/Al:Si three layer filters were measured between 260 and 3000 eV. The main purpose of the calibration was to determine a model transmission function with an accuracy of better than 1 percent. We present results from fits of model transmission functions to the measured x-ray transmission data. Detailed fine energy scans above the Al-K and C-K absorption edges revealed the presence of fine oscillations of the x-ray transmission. These features are most likely extended x-ray absorption fine structures (EXAFS). The amplitude of the EXAFS oscillations above the Al absorption edge is about 5 percent of the mean value of the x-ray transmission. EXAFS theory predicts a temperature dependence on the amplitude of the EXAFS oscillations. This dependence arises from the fact that thermal vibrations of the atoms in a solid produce a phase mismatch of the backscattered electron wave function. Since the ACIS filters will be at a much lower temperature on orbit we provide a prediction of the EXAFS component for the expected on orbit temperature of the ACIS filters.

Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV

For the past six years, a high-accuracy reflectance calibration system has been under development at the National Synchrotron Light Source at Brookhaven National Laboratory. The system utilizes Los Alamos National Laboratorys Beamlines X8A and X8C. Its purpose is to calibrate the reflection efficiencies of witness coupons associated with the coating of the eight mirror elements composing the High Resolution Mirror Assembly for NASAs Advanced X-ray Astrophysics Facility (AXAF). During the past year, measurements of reflectances of numerous iridium- coated witness flat mirrors have been obtained to a relative statistical precision of 0.4 percent, and an overall repeatability within 0.8 percent in the overlapping energy regions. The coating processes are strikingly repeatable, with reflectances in the 5-10 keV range for off-end witness flats nearly always being within 1 percent of one another, excluding interference fringes. The comparison reflectances between flats obtained from qualification coating runs and production runs of the Wolter Type I mirror elements are in turn nearly equal, indicating that the qualification run witness flats provide a good representation of the flight optics. Results will produce a calibration of AXAF with extremely good energy detail over the 2-12 keV range, which includes details of the M-absorption edge region for Ir. Development of the program to cover 0.05-2 keV continues.

Development of beamline U3A for AXAF synchrotron reflectivity calibrations

We discuss the development of beamline U3A at NSLS for AXAF telescope witness mirror reflectivity calibrations in the 1- 2 keV energy range. The beamline was originally constructed as a white light beamline and has been upgraded with the addition of a monochromator to meet the needs of the AXAF calibration program. The beamline consists of an upstream horizontally focussing gold coated elliptical mirror, a differential pumping section, a sample/filter chamber, a monochromator and a downstream filter set. The mirror is set at a 2 degree incident angle for a nominal high energy cutoff at 2 keV. The monochromator is a separated element, scanning, double crystal/multilayer design having low to moderate energy resolution. A fixed exit beam is maintained through the 7-70 degree Bragg angle range by longitudinal translation of the second scanning crystal. Tracking is achieved by computer control of the scan motors with lookup table positioning of the crystal rotary tables. All motors are in vacuum and there are no motional feedthroughs. Several different multilayer or crystal pairs are co-mounted on the monochromator crystal holders and can be exchanged in situ. Currently installed are a W/Si multilayer pair, beryl, and Na-(beta) alumina allowing energy coverage from 180 eV to 2000 eV. Measurements with Na-(beta) alumina and beryl show that beam impurity less than 0.1 percent can be achieved in the 1-2 keV energy range. Measured resolving powers are E/(Delta) E equals 60 for W/Si, 500-800 for (beta) alumina and 1500 to 3000 for beryl. Initial results suggest that signal to noise and beam purity are adequate in the 1-2 keV region to achieve the 1 percent calibration accuracy required by AXAF. This allows overlap of Ir MV edge data taken on x-ray beamline X8A and with low energy data taken on ALS beamline 6.3.2.