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David A. Grosch

IBM

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Publication

Featured researches published by David A. Grosch.

Ibm Journal of Research and Development | 2007

Optimization of silicon technology for the IBM system z9

Daniel J. Poindexter; Scott Richard Stiffler; Philip T. Wu; Paul D. Agnello; Thomas H. Ivers; Shreesh Narasimha; Thomas B. Faure; Jed H. Rankin; David A. Grosch; Marc D. Knox; Daniel C. Edelstein; M. Khare; Gary B. Bronner; Hyunjang Nam; Shahid Butt

IBM 90-nm silicon-on-insulator (SOI) technology was used for the key chips in the System z9TM processor chipset. Along with system design, optimization of some critical features of this technology enabled the z9TM to achieve double the system performance of the previous generation. These technology improvements included logic and SRAM FET optimization, mask fabrication, lithography and wafer processing, and interconnect technology. Reliability improvements such as SRAM optimization and burn-in reliability screen are also described.

Ibm Journal of Research and Development | 2007

IBM System z9 eFUSE applications and methodology

Richard F. Rizzolo; Thomas G. Foote; James M. Crafts; David A. Grosch; Tak O. Leung; David J. Lund; Bryan L. Mechtly; Bryan J. Robbins; Timothy J. Slegel; Michael J. Tremblay; Glen A. Wiedemeier

Archive | 2008

Integrated circuit testing methods using well bias modification

Anne E. Gattiker; David A. Grosch; Marc D. Knox; Phil Nigh; Jody J. Van Horn; Paul S. Zuchowski

Archive | 1998

Burn in technique for chips containing different types of IC circuitry

David A. Grosch; Marc D. Knox

Archive | 2011

Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns

David A. Grosch; Marc D. Knox; Erik A. Nelson; Brian C. Noble

Archive | 2011

Efficient methods and apparatus for margin testing integrated circuits

David A. Grosch; Marc D. Knox; Erik A. Nelson; Brian C. Noble

Archive | 2016

Diversified exerciser and accelerator

David A. Grosch; Gregory V. Miller; Brian C. Noble; Ann Swift; Joel Thomas; Jody J. Van Horn

Archive | 2003

Procedes de test de circuit integre faisant intervenir la modification de polarisation de puits

Anne E. Gattiker; David A. Grosch; Marc D. Knox; Phil Nigh; Horn Jody Van; Paul S. Zuchowski

Archive | 2003

Testverfahren für integrierte schaltungen mit verwendung modifikation von well-spannungen Test method for integrated circuits with use modification of well-voltages

Anne Austin Gattiker; David A. Grosch; Marc D. Knox; Phil Nigh; Horn Jody Van; Paul S. Zuchowski

Archive | 2003

Test methods for integrated circuits with use modification of well-voltages

Anne E. Gattiker; David A. Grosch; Marc D. Knox; Phil Nigh; Horn Jody Van; Paul S. Zuchowski

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Marc D. Knox

IBM

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Paul S. Zuchowski

IBM

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Phil Nigh

Carnegie Mellon University

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Anne E. Gattiker

Carnegie Mellon University

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Brian C. Noble

IBM

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Erik A. Nelson

IBM

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Jody J. Van Horn

IBM

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Ann Swift

IBM

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Anne E. Gattiker

Carnegie Mellon University

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Bryan J. Robbins

IBM

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