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IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B | 1996

Theory of pressure sintering of glass ceramic multichip carriers

Ho-Ming Tong; David B. Goland; Dudley Augustus Chance

A method of pressure sintering multilayer glass ceramic packages (MLC) that results in a hermetic product is described. Use of this process results in a reduced process time, and is achieved without the use of a die, which is commonly employed during pressure sintering. Complex glass ceramic multichip substrates have been sintered this way to produce products with a flat edge contour and minimal distortion of the internal vias. In this article, we present a model that provides the fundamental basis for the pressure sintering approach to processing MLC. In this semi-quantitative model, the mechanism of pressure sintering, i.e., the process of dimensional changes, is controlled by viscous flow induced by sintering, and lamination flow created by an applied pressure. The pressure sintering model is capable of predicting the flow, density, and dimensional changes of a glass ceramic carrier during pressure sintering in the absence of a die. Both the temperature and pressure schedules are time dependent, and the pressure can vary over a range from zero, corresponding to free sintering, to large pressures (up to at least 800 psi) that closely simulate experimental data.


Archive | 1991

Semiconductor chip interposer module with engineering change wiring and distributed decoupling capacitance

Dudley Augustus Chance; Evan E. Davidson; Timothy R. Dinger; David B. Goland; David P. LaPotin


Archive | 1993

Process for producing circuitized layers and multilayer ceramic sub-laminates and composites thereof

Jon A. Casey; David B. Goland; Dinesh Gupta; Lester Wynn Herron; James N. Humenik; Thomas E. Lombardi; John U. Knickerbocker; Robert J. Sullivan; James R. Wylder


Archive | 1998

Repair process for aluminum nitride substrates

David B. Goland; Mark J. LaPlante; David C. Long; Dale McHerron; Krishna G. Sachdev; Subhash L. Shinde


Physical Review B | 1990

ac susceptibility and grain-boundary pinning strengths in YBa2Cu3O7- delta and YBa2Cu2.985Ag0.015O7- delta.

Subhash L. Shinde; J. Morrill; David B. Goland; Dudley Augustus Chance; T. R. McGuire


Archive | 1998

Multi-chip heat-sink cap assembly

Giulio DiGiacomo; Stephen S. Drofitz; David L. Edwards; Larry D. Gross; Sushumna Iruvanti; Raed A. Sherif; Subhash L. Shinde; David J. Womac; David B. Goland; Lester Wynn Herron


Physical Review B | 1990

ac susceptibility and grain-boundary pinning strengths in YBa sub 2 Cu sub 3 O sub 7 minus. delta. and YBa sub 2 Cu sub 2. 985 Ag sub 0. 015 O sub 7 minus. delta

Subhash L. Shinde; J. Morrill; David B. Goland; Dudley Augustus Chance; T. R. McGuire


Archive | 1996

Aluminum nitride body having graded metallurgy

Jon A. Casey; Carla Natalia Cordero; Benjamin V. Fasano; David B. Goland; Robert Hannon; Jonathan H. Harris; Lester Wynn Herron; Gregory M. Johnson; Niranjan M. Patel; Andrew Michael Reitter; Subhash L. Shinde; Rao V. Vallabhaneni; Robert A. Youngman


Archive | 1991

Method for producing multi-layer ceramic substrates with oxidation resistant metalization

Dudley Augustus Chance; Gareth G. Hougham; David B. Goland


Archive | 1999

Multi-chip module and heat-sink cap combination

Giulio DiGiacomo; Stephen S. Drofitz; David L. Edwards; Larry D. Gross; Sushumna Iruvanti; Raed A. Sherif; Subhash L. Shinde; David J. Womac; David B. Goland; Lester Wynn Herron

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