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David L. Gardell

IBM

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Publication

Featured researches published by David L. Gardell.

Archive | 1999

Semiconductor wafer test and burn-in

James M. Leas; Robert William Koss; Jody J. Van Horn; George Frederick Walker; Charles Hampton Perry; David L. Gardell; Steve Leo Dingle; Ronald Jay Prilik

Archive | 1999

Segmented architecture for wafer test and burn-in

Thomas W. Bachelder; Dennis R. Barringer; Dennis R. Conti; James M. Crafts; David L. Gardell; Paul M. Gaschke; Mark Raymond Laforce; Charles Hampton Perry; Roger R. Schmidt; Joseph John Van Horn; Wade H. White

Archive | 1998

Method and apparatus for cooling an electronic device

Richard James Evans; David L. Gardell; Anthony M. Palagonia

Archive | 1998

Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing

Ethan E. Gallagher; David L. Gardell; Paul M. Gaschke

Archive | 1993

Encapsulated semiconductor chip module and method of forming the same

Francis Eugene Froebel; David L. Gardell; Gary Hugh Irish; Mohammed S. Shaikh

Archive | 1999

ACTIVELY CONTROLLED HEAT SINK FOR CONVECTIVE BURN-IN OVEN

John A. Fredeman; David L. Gardell; Marc D. Knox; Mark Raymond Laforce

Archive | 2005

METHOD AND APPARATUS FOR TEMPORARY THERMAL COUPLING OF AN ELECTRONIC DEVICE TO A HEAT SINK DURING TEST

Paul J. Aube; Normand Cote; Roger G. Gamache; David L. Gardell; Paul M. Gaschke; Marc D. Knox; Denis D. Turcotte

Archive | 1994

High power capacity magnetron cathode

David L. Gardell; David C. Strippe

Archive | 1998

Co-axial bellows liquid heatsink for high power module test

David L. Gardell; Krisztian Gaspar; Guy C. Morin

Archive | 2001

Method of burning in an integrated circuit chip package

Roger G. Gamache; David L. Gardell; Marc D. Knox

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David M. Audette

IBM

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Charles Hampton Perry

IBM

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Dustin M. Fregeau

IBM

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Marc D. Knox

IBM

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George Frederick Walker

IBM

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James M. Leas

IBM

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Normand Cote

IBM

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Paul M. Gaschke

IBM

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Robert William Koss

IBM

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Roger G. Gamache

IBM

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