Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where James M. Leas is active.

Publication


Featured researches published by James M. Leas.


Archive | 1999

Semiconductor wafer test and burn-in

James M. Leas; Robert William Koss; Jody J. Van Horn; George Frederick Walker; Charles Hampton Perry; David L. Gardell; Steve Leo Dingle; Ronald Jay Prilik


Archive | 1995

Method and workpiece for connecting a thin layer to a monolithic electronic module's surface and associated module packaging

Kenneth E. Beilstein; Claude L. Bertin; John Edward Cronin; Wayne J. Howell; James M. Leas; David Jacob Perlman


Archive | 1997

Multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodes

Paul E. Bakeman; Claude L. Bertin; Erik Leight Hedberg; James M. Leas; Steven H. Voldman


Archive | 1996

Method for forming a monolithic electronic module by dicing wafer stacks

James M. Leas; Steven H. Voldman


Archive | 1994

Electronic modules with interconnected surface metallization layers and fabrication methods therefore

Kenneth E. Beilstein; Claude L. Bertin; John Edward Cronin; Wayne J. Howell; James M. Leas; Robert B. Phillips


Archive | 1980

Thin film semiconductor device and method for manufacture

Steven G. Barbee; James M. Leas; J. R. Lloyd; Arunachala Nagarajan


Archive | 1997

Methods for fabricating multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodes

Claude L. Bertin; Erik L. Hedberg; James M. Leas; Steven H. Voldman


Archive | 1991

Edge masking spin tool

Howard L. Kelly; Hans-George H. Kolan; James M. Leas; Teruhiro Nakasogi


Archive | 1995

Electronic modules with interconnected surface metallization layers

Kenneth E. Beilstein; Claude L. Bertin; John Edward Cronin; Wayne J. Howell; James M. Leas; Robert B. Phillips


Archive | 1997

Metal removal cleaning process and apparatus

Edward Daniel Buker; Edward W. Conrad; James M. Leas

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